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2016

Kawai, Shigeki and Foster, Adam S. and Björkman, Torbjörn and Nowakowska, Sylwia and Björk, Jonas and Canova, Filippo Federici and Gade, Lutz H. and Jung, Thomas A. and Meyer, Ernst. (2016) Van der Waals interactions and the limits of isolated atom models at interfaces. Nature communications, 7. p. 11559.

Pawlak, Remy and Ouyang, Wengen and Filippov, Alexander E. and Kalikhman-Razvozov, Lena and Kawai, Shigeki and Glatzel, Thilo and Gnecco, Enrico and Baratoff, Alexis and Zheng, Quanshui and Hod, Oded and Urbakh, Michael and Meyer, Ernst. (2016) Single-Molecule Tribology: Force Microscopy Manipulation of a Porphyrin Derivative on a Copper Surface. ACS Nano, 10 (1). pp. 713-722.

Prauzner-Bechcicki, Jakub S. and Zajac, Lukasz and Olszowski, Piotr and Johr, Res and Hinaut, Antoine and Glatzel, Thilo and Such, Bartosz and Meyer, Ernst and Szymonski, Marek. (2016) Scanning probe microscopy studies on the adsorption of selected molecular dyes on titania. Beilstein Journal of Nanotechnology, 7. pp. 1642-1653.

Stehlik, S. and Glatzel, T. and Pichot, V. and Pawlak, R. and Meyer, E. and Spitzer, D. and Rezek, B.. (2016) Water interaction with hydrogenated and oxidized detonation nanodiamonds - Microscopic and spectroscopic analyses. Diamond and Related Materials, 63. pp. 97-102.

Zajac, Lukasz and Olszowski, Piotr and Godlewski, Szymon and Bodek, Lukasz and Such, Bartosz and Johr, Res and Pawlak, Remy and Hinaut, Antoine and Glatzel, Thilo and Meyer, Ernst and Szymonski, Marek. (2016) Self-assembling of Zn porphyrins on a (110) face of rutile TiO2-The anchoring role of carboxyl groups. Applied Surface Science, 379. pp. 277-281.

Eren, B. and Gysin, U. and Marot, L. and Glatzel, Th and Steiner, R. and Meyer, E.. (2016) Work function of few layer graphene covered nickel thin films measured with Kelvin probe force microscopy. Applied Physics Letters, 108 (4). 041602.

Freund, Sara and Hinaut, Antoine and Pawlak, Remy and Liu, Shi-Xia and Decurtins, Silvio and Meyer, Ernst and Glatzel, Thilo. (2016) Morphology Change of C-60 Islands on Organic Crystals Observed by Atomic Force Microscopy. ACS Nano, 10 (6). pp. 5782-5788.

Gysin, U. and Meyer, E. and Glatzel, Th and Guenzburger, G. and Rossmann, H. R. and Jung, T. A. and Reshanov, S. and Schoener, A. and Bartolf, H.. (2016) Dopant imaging of power semiconductor device cross sections. Microelectronic Engineering, 160. pp. 18-21.

Huber, Francois and Lang, Hans Peter and Gatz, Katharina and Rimoldi, Donata and Meyer, Ernst and Gerber, Christoph. (2016) Fast Diagnostics of BRAF Mutations in Biopsies from Malignant Melanoma. Nano Letters, 16 (9). pp. 5373-5377.

Kawai, Shigeki and Benassi, Andrea and Gnecco, Enrico and Soede, Hajo and Pawlak, Remy and Feng, Xinliang and Muellen, Klaus and Passerone, Daniele and Pignedoli, Carlo A. and Ruffieux, Pascal and Fasel, Roman and Meyer, Ernst. (2016) Superlubricity of graphene nanoribbons on gold surfaces. Science, 351 (6276). pp. 957-961.

Kawai, Shigeki and Haapasilta, Ville and Lindner, Benjamin D. and Tahara, Kazukuni and Spijker, Peter and Buitendijk, Jeroen A. and Pawlak, Remy and Meier, Tobias and Tobe, Yoshito and Foster, Adam S. and Meyer, Ernst. (2016) Thermal control of sequential on-surface transformation of a hydrocarbon molecule on a copper surface. Nature Communications, 7. p. 12711.

Kawai, Shigeki and Sadeghi, Ali and Okamoto, Toshihiro and Mitsui, Chikahiko and Pawlak, Remy and Meier, Tobias and Takeya, Jun and Goedecker, Stefan and Meyer, Ernst. (2016) Organometallic Bonding in an Ullmann-Type On-Surface Chemical Reaction Studied by High-Resolution Atomic Force Microscopy. Small, 12 (38). pp. 5303-5311.

Krywko-Cendrowska, A. and Marot, L. and Strawski, M. and Steiner, R. and Meyer, E.. (2016) Electrodeposition and Characterization of SiOx Films Photoactive in Organic Solution. Journal of the Electrochemical Society, 163 (3). D100-D106.

Lang, Hans Peter and Loizeau, Frederic and Hiou-Feige, Agnes and Rivals, Jean-Paul and Romero, Pedro and Akiyama, Terunobu and Gerber, Christoph and Meyer, Ernst. (2016) Piezoresistive Membrane Surface Stress Sensors for Characterization of Breath Samples of Head and Neck Cancer Patients. Sensors, 16 (7). p. 1149.

Marot, L. and De Temmerman, G. and van den Berg, M. A. and Renault, P. O. and Covarel, G. and Joanny, M. and Travere, J. M. and Steiner, R. and Mathys, D. and Meyer, E.. (2016) ITER first mirror mock-ups exposed in Magnum-PSI. Nuclear Fusion, 56 (6). 066015.

Moller, Christel and Spieler, Katrein and Calame, Michel and Meyer, Ernst. (2016) From Bachelor to PhD: The Swiss Nanoscience Institute at the University of Basel Offers Excellent Interdisciplinary Education at All Levels. In: Global Perspectives of Nanoscience and Engineering Education. Berlin, pp. 351-373.

Moser, L. and Marot, L. and Steiner, R. and Newman, M. and Widdowson, A. and Ivanova, D. and Likonen, J. and Petersson, P. and Pintsuk, G. and Rubel, M. and Meyer, E. and Contributors, J. E. T.. (2016) Plasma cleaning of beryllium coated mirrors. Physica Scripta, T167. 014069.

Rossmann, H. R. and Gysin, U. and Bubendorf, A. and Glatzel, T. and Reshanov, S. A. and Zhang, A. and Schoner, A. and Jung, T. A. and Meyer, E. and Bartolf, H.. (2016) Junction Barrier Schottky (JBS) Rectifier Interface Engineering Facilitated by Two-Dimensional (2D) Dopant Imaging. Materials Science Forum, 858. pp. 497-500.

2015

Hinaut, Antoine and Pawlak, Remy and Meyer, Ernst and Glatzel, Thilo. (2015) Electrospray deposition of organic molecules on bulk insulator surfaces. Beilstein Journal of Nanotechnology, 6. 1927-1934.

Olszowski, Piotr and Zajac, Lukasz and Godlewski, Szymon and Such, Bartosz and Joehr, Res and Glatzel, Thilo and Meyer, Ernst and Szymonski, Marek. (2015) Role of a Carboxyl Group in the Adsorption of Zn Porphyrins on TiO2(011)-2x1 Surface. The Journal of Physical Chemistry C, 119 (37). pp. 21561-21566.

Joehr, Res and Hinaut, Antoine and Pawlak, Remy and Sadeghi, Ali and Saha, Santanu and Goedecker, Stefan and Such, Bartosz and Szymonski, Marek and Meyer, Ernst and Glatzel, Thilo. (2015) Characterization of individual molecular adsorption geometries by atomic force microscopy: Cu-TCPP on rutile TiO2 (110). Journal of Chemical Physics, 143 (9). 094202.

Pawlak, Remy and Marot, Laurent and Sadeghi, Ali and Kawai, Shigeki and Glatzel, Thilo and Reimann, Peter and Goedecker, Stefan and Guentherodt, Hans-Joachim and Meyer, Ernst. (2015) Chain-like structure elements in Ni40Ta60 metallic glasses observed by scanning tunneling microscopy. Scientific Reports, 5. p. 13143.

Kawai, Shigeki and Saito, Shohei and Osumi, Shinichiro and Yamaguchi, Shigehiro and Foster, Adam S. and Spijker, Peter and Meyer, Ernst. (2015) Atomically controlled substitutional boron-doping of graphene nanoribbons. Nature Communications, 6. p. 8098.

Moser, Lucas and Steiner, Roland and Leipold, Frank and Reichle, Roger and Marot, Laurent and Meyer, Ernst. (2015) Plasma cleaning of ITER First Mirrors in magnetic field. Journal of Nuclear Materials, 463. pp. 940-943.

Godlewski, Szymon and Prauzner-Bechcicki, Jakub S. and Glatzel, Thilo and Meyer, Ernst and Szymonski, Marek. (2015) Transformations of PTCDA structures on rutile TiO2 induced by thermal annealing and intermolecular forces. Beilstein Journal of Nanotechnology, 6. pp. 1498-1507.

Meyer, Ernst. (2015) Controlling friction atom by atom. Science, 348 (6239). p. 1089.

Kawai, Shigeki and Sadeghi, Ali and Xu, Feng and Peng, Lifen and Orita, Akihiro and Otera, Junzo and Goedecker, Stefan and Meyer, Ernst. (2015) Extended Halogen Bonding between Fully Fluorinated Aromatic Molecules. ACS Nano, 9 (3). pp. 2574-2583.

Eren, Baran and Fu, Wangyang and Marot, Laurent and Calame, Michel and Steiner, Roland and Meyer, Ernst. (2015) Spectroscopic ellipsometry on Si/SiO2/graphene tri-layer system exposed to downstream hydrogen plasma: Effects of hydrogenation and chemical sputtering. Applied Physics Letters, 106 (1). 011904.

Gnecco, Enrico and Meyer, Ernst. (2015) Fundamentals of friction and wear on the nanoscale : Preface. In: Fundamentals of friction and wear on the nanoscale. Berlin, V.

Maier, Sabine and Gnecco, Enrico and Meyer, Ernst. (2015) Atomic-Scale Friction Measurements in Ultra-High Vacuum. In: Fundamentals of Friction and Wear on the Nanoscale, Part II. pp. 95-114.

Nowakowska, Sylwia and Waeckerlin, Aneliia and Kawai, Shigeki and Ivas, Toni and Nowakowski, Jan and Fatayer, Shadi and Waeckerlin, Christian and Nijs, Thomas and Meyer, Ernst and Bjork, Jonas and Stohr, Meike and Gade, Lutz H. and Jung, Thomas A.. (2015) Interplay of weak interactions in the atom-by-atom condensation of xenon within quantum boxes. Nature communications, 6. p. 6071.

Bartolf, H. and Gysin, U. and Glatzel, T. and Rossmann, H. R. and Jung, T. A. and Reshanov, S. A. and Schöner, A. and Meyer, E.. (2015) Improving the Design of the Shield for the Electric Field in SiC-Based Schottky-Rectifiers and Ion-Implantation Cascades by SPM Dopant-Imaging. Microelectronic Engineering, 148. pp. 1-4.

Gysin, Urs and Glatzel, Thilo and Schmölzer, Thomas and Schöner, Adolf and Reshanov, Sergey and Bartolf, Holger and Meyer, Ernst. (2015) Large area scanning probe microscope in ultra-high vacuum demonstrated for electrostatic force measurements on high-voltage devices. Beilstein Journal of Nanotechnology, 6. pp. 2485-2497.

Jöhr, Res and Zajac, Lukasz and Günzburger, Gino and Hug, Hubert and Such, Bartosz and Szymonski, Marek and Meyer, Ernst and Glatzel, Thilo. (2015) Impact of photocatalysis on carotenoic acid dye-sensitized solar cells. Hybrid Materials, 2 (1).

Pawlak, Rémy and Kawai, Shigeki and Glatzel, Thilo and Meyer, Ernst. (2015) Single molecule force spectroscopy. In: Noncontact atomic force microscopy. pp. 195-222.

Pawlak, Rémy and Ouyang, Wengen and Filippov, Alexander E. and Kalikhman-Razvozov, Lena and Kawai, Shigeki and Glatzel, Thilo and Gnecco, Enrico and Baratoff, Alexis and Zheng, Quan-Shui and Hod, Oded and Urbakh, Michael and Meyer, Ernst. (2015) Single Molecule Tribology: Force Microscopy Manipulation of a Porphyrin Derivative on a Copper Surface. ACS Nano, 10 (1). pp. 713-722.

Rossmann, H. R. and Gysin, Urs and Bubendorf, Alexander and Glatzel, Thilo and Reshanov, Sergey and Schöner, Adolf and Jung, T. A. and Meyer, Ernst and Bartolf, Holger. (2015) Two-Dimensional Carrier Profiling on Lightly Doped n-Type 4H-SiC Epitaxially Grown Layers. Materials Science Forum, 821-823. pp. 269-272.

Stehlik, S. and Glatzel, T. and Pichot, V. and Pawlak, R. and Meyer, E. and Spitzer, D. and Rezek, B.. (2015) Water interaction with hydrogenated and oxidized detonation nanodiamonds — Microscopic and spectroscopic analyses. Diamond and Related Materials, 63. pp. 97-102.

Rossmann, H. R. and Bubendorf, A. and Zanella, F. and Marjanovic, N. and Schnieper, M. and Meyer, E. and Jung, T. A. and Gobrecht, J. and Minamisawa, R. A. and Bartolf, H.. (2015) Device Simulations on Novel High Channel Mobility 4H-SiC Trench MOSFETs and Their Fabrication Processes. Microelectronic Engineering, 145. pp. 166-169.

2014

Eren, B. and Marot, L. and Guenzburger, G. and Renault, P.-O. and Glatzel, Th and Steiner, R. and Meyer, E.. (2014) Hydrogen-induced buckling of gold films. Journal of physics. D, Applied physics, 47 (2). 025302.

M. Langer, M. Kisiel and R. Pawlak, F. Pelligrini and G. E. Santoro, R. Buzio and A. Gerbi, G. Balakrishnan and A. Baratoff, E. Tosatti and Meyer, E.. (2014) Giant frictional dissipation peaks and charge-density-wave slips at the NbSe2 surface. Nature materials, Vol. 13. S. 173-177.

Kawai, Shigeki and Koch, Matthias and Gnecco, Enrico and Sadeghi, Ali and Pawlak, Remy and Glatzel, Thilo and Schwarz, Jutta and Goedecker, Stefan and Hecht, Stefan and Baratoff, Alexis and Grill, Leonhard and Meyer, Ernst. (2014) Quantifying the atomic-level mechanics of single long physisorbed molecular chains. Proceedings of the National Academy of Sciences of the United States of America, 111 (11). S. 3968-3972.

Kawai, S. and Foster, A. S. and Federici Canova, F. and Onodera, H. and Kitamura, S. and Meyer, E.. (2014) Atom manipulation on an insulating surface at room temperature. Nature communications, Vol. 5 , Article Nr. 4403.

Fessler, Gregor and Eren, Baran and Gysin, Urs and Glatzel, Thilo and Meyer, Ernst. (2014) Friction force microscopy studies on SiO2 supported pristine and hydrogenated graphene. Applied physics letters, 104 (4). 041910.

Kawai, S. and Eren, B. and Marot, L. and Meyer, E.. (2014) Graphene Synthesis viaThermal Polymerization of Aromatic Quinone Molecules. ACS nano, Vol. 8, H. 6. S. 5932-5938.

B. Eren, L. Marot and R. Steiner, T. de los Arcos and M. Düggelin, D. Mathys and K. N. Goldie, V. Olivieri and Meyer, E.. (2014) Carbon nanotube growth on AlN support : comparison between Ni and Fe chemical states and morphology. Chemical physics letters, Vol. 609. S. 82-87.

S. Iyyakkunnel, L. Marot and B. Eren, R. Steiner and L. Moser, D. Mathys and M. Dueggelin, P. Chapon and Meyer, E.. (2014) Morphological changes of tungsten surfaces by low-flux helium plasma treatment and helium incorporation via magnetron sputtering. ACS applied materials & interfaces, Vol. 6, H. 14. S. 11609-11616.

Wasem, Matthias and Koeser, Joachim and Hess, Sylvia and Gnecco, Enrico and Meyer, Ernst. (2014) Exploring the retention properties of CaF2nanoparticles as possible additives for dental care application with tapping-mode atomic force microscope in liquid. Beilstein journal of nanotechnology, Vol. 5. S. 36-42.

A. Uccello, B. Eren and L. Marot, D. Dellasega and A. Maffini, R. Steiner and D. Mathys, E. Meyer and Passoni, M.. (2014) Deuterium plasma exposure of rhodium films : Role of morphology and crystal structure. Journal of nuclear materials, Vol. 446, H. 1-3. S. 106-112.

M. Wisse, L. Marot and A. Widdowson, M. Rubel and D. Ivanova, P. Petersson and R. P. Doerner, M. J. Baldwin and J. Likonen, E. Alves and A. Hakola, S. Koivuranta and R. Steiner, E. Meyer. (2014) Laser-assisted cleaning of beryllium-containing mirror samples from JET and PISCES-B. Fusion Engineering and Design, 89 (2). pp. 122-130.

M. Wisse, L. Marot and R. Steiner, D. Mathys and A. Stumpp, M. Joanny and J. M. Travere, E. Meyer. (2014) Picosecond and nanosecond laser ablation of mixed tungsten/aluminium films. Fusion science and technology, 66 (2). pp. 308-314.

Kawai, Shigeki and Sadeghi, Ali and Xu, Feng and Peng, Lifen and Pawlak, Rémy and Glatzel, Thilo and Willand, Alexander and Orita, Akihiro and Otera, Junzo and Goedecker, Stefan and Meyer, Ernst. (2014) Correction to Obtaining Detailed Structural Information about Supramolecular Systems on Surfaces by Combining High-Resolution Force Microscopy with ab Initio Calculations. ACS Nano, 8 (3). p. 3099.

Zhang, Jun and Shchyrba, Aneliia and Nowakowska, Sylwia and Meyer, Ernst and Jung, Thomas A. and Muntwiler, Matthias. (2014) Probing the spatial and momentum distribution of confined surface states in a metal coordination network. Chemical Communications , 50 (82). pp. 12289-12292.

2013

Henning, Alex and Günzburger, Gino and Jöhr, Res and Rosenwaks, Yossi and Bozic-Weber, Biljana and Housecroft, Catherine E. and Constable, Edwin C. and Meyer, Ernst and Glatzel, Thilo. (2013) Kelvin Probe Force Microscopy of Nanocrystalline TiO2 Photoelectrodes. Beilstein Journal of Nanotechnology, 4. pp. 418-428.

Baran Eren, and Thilo Glatzel, and Marcin Kisiel, and Wangyang Fu, and Rémy Pawlak, and Urs Gysin, and Cornelia Nef, and Laurent Marot, and Michel Calame, and Christian Schönenberger, and Ernst Meyer, . (2013) Hydrogen plasma microlithography of graphene supported on a Si/SiO2 substrate. Applied physics letters, Vol. 102, H. 7 , 071602.

Wisse, M. and Marot, L. and Eren, B. and Steiner, R. and Mathys, D. and Meyer, E.. (2013) Laser damage thresholds of ITER mirror materials and first results on in situ laser cleaning of stainless steel mirrors. Fusion engineering and design, Vol. 88, H. 5. S. 388-399.

Pawak, Remy and Glatzel, Thilo and Pichot, Vincent and Schmidlin, Loic and Kawai, Shigeki and Fremy, Sweetlana and Spitzer, Denis and Meyer, Ernst. (2013) Local Detection of Nitrogen-Vacancy Centers in a Nanodiamond Monolayer. Nano letters, Vol. 13, H. 12. S. 5803-5807.

Eren, B. and Marot, L. and Ryzhkov, I. V. and Lindig, S. and Houben, A. and Wisse, M. and Skoryk, O. O. and Oberkofler, M. and Voitsenya, V. S. and Linsmeier, Ch. and Meyer, E.. (2013) Roughening and reflection performance of molybdenum coatings exposed to a high-flux deuterium plasma. Nuclear fusion, Vol. 53, H. 11 , 113013.

Marot, Laurent and Linsmeier, Christian and Eren, Baran and Moser, Lucas and Steiner, Roland and Meyer, Ernst. (2013) Can aluminium or magnesium be a surrogate for beryllium : a critical investigation of their chemistry. Fusion engineering and design, Vol. 88, H. 9-10. S. 1718-1721.

Kawai, Shigeki and Sadeghi, Ali and Feng, Xu and Lifen, Peng and Pawlak, Remy and Glatzel, Thilo and Willand, Alexander and Orita, Akihiro and Otera, Junzo and Goedecker, Stefan and Meyer, Ernst. (2013) Obtaining Detailed Structural Information about Supramolecular Systems on Surfaces by Combining High-Resolution Force Microscopy with ab Initio Calculations. ACS nano, Vol. 7, H. 10. S. 9098-9105.

Canova, Filippo Federici and Kawai, Shigeki and de Capitani, Christian and Kan`no, Ken-ichi and Glatzel, Thilo and Such, Bartosz and Foster, Adam S. and Meyer, Ernst. (2013) Energy Loss Triggered by Atomic-Scale Lateral Force. Physical review letters, Vol. 110, H. 20 , 203203.

Eren, Baran and Wisse, Marco and Marot, Laurent and Steiner, Roland and Meyer, Ernst. (2013) Deuterium plasma exposure on rhodium : reflectivity monitoring and evidence of subsurface deuteride formation. Applied surface science, Vol. 273. S. 94-100.

Koch, Sascha and Stradi, Daniele and Gnecco, Enrico and Barja, Sara and Kawai, Shigeki and Diaz, Cristina and Alcami, Manuel and Martin, Fernando and Vazquez de Parga, Amadeo Lopez and Miranda, Rodolfo and Glatzel, Thilo and Meyer, Ernst. (2013) Elastic Response of Graphene Nanodomes. ACS nano, Vol. 7, H. 4. S. 2927-2934.

Kawai, Shigeki and Pina, Carlos M. and Bubendorf, Alexander and Fessler, Gregor and Glatzel, Thilo and Gnecco, Enrico and Meyer, Ernst. (2013) Systematic study of the dolomite (104) surface by bimodal dynamic force microscopy in ultra-high vacuum. Nanotechnology, Vol. 24, H. 5 , 055702.

Wirtz, Tom and Fleming, Yves and Gysin, Urs and Glatzel, Thilo and Wegmann, Urs and Meyer, Ernst and Maier, Urs and Rychen, Joerg. (2013) Combined SIMS-SPM instrument for high sensitivity and high-resolution elemental 3D analysis. Surface and interface analysis, Vol. 45, H. 1,. S. 513-516.

Marot, L. and De Temmerman, G. and Doerner, R. P. and Umstadter, K. and Wagner, R. S. and Mathys, D. and Duggelin, M. and Meyer, E.. (2013) Synergistic effects of hydrogen plasma exposure, pulsed laser heating and temperature on rhodium surfaces. Journal of nuclear materials, Vol. 432, H. 1-3. S. 388-394.

2012

Koch, S. and Langer, M. and Kawai, S. and Meyer, E. and Glatzel, Th. (2012) Contrast inversion of the h-BN nanomesh investigated by nc-AFM and Kelvin probe force microscopy. Journal of physics. Condensed matter, Vol. 24, H. 31 , 314212.

Sadeghi, Ali and Baratoff, Alexis and Ghasemi, S. Alireza and Goedecker, Stefan and Glatzel, Thilo and Kawai, Shigeki and Meyer, Ernst. (2012) Multiscale approach for simulations of Kelvin probe force microscopy with atomic resolution. Physical Review B, Vol. 86, H. 7 , 075407.

Kawai, Shigeki and Canova, Filippo Federici and Glatzel, Thilo and Hynninen, Teemu and Meyer, Ernst and Foster, Adam S.. (2012) Measuring Electric Field Induced Subpicometer Displacement of Step Edge Ions. Physical review letters, Vol. 109, H. 14 , 146101.

Eren, B. and Hug, D. and Marot, L. and Pawlak, R. and Kisiel, M. and Steiner, R. and Zumbühl, D. M. and Meyer, E.. (2012) Pure hydrogen low-temperature plasma exposure of HOPG and graphene: Graphane formation? Beilstein journal of nanotechnology, Vol. 3. S. 852-859.

Kawai, Shigeki and Glatzel, Thilo and Such, Bartosz and Koch, Sascha and Baratoff, Alexis and Meyer, Ernst. (2012) Energy dissipation in dynamic force microscopy on KBr(001) correlated with atomic-scale adhesion phenomena. Physical Review B, Vol. 86, H. 24 , 245419.

Wisse, M. and Eren, B. and Marot, L. and Steiner, R. and Meyer, E.. (2012) Spectroscopic reflectometry of mirror surfaces during plasma exposure. Review of scientific instruments, Vol. 83 , 013509.

Such, Bartosz and Glatzel, Thilo and Kawai, Shigeki and Meyer, Ernst and Turansky, Robert and Brndiar, Jan and Stich, Ivan. (2012) Interplay of the tip-sample junction stability and image contrast reversal on a Cu(111) surface revealed by the 3D force field. Nanotechnology, Vol. 23, H. 4. S. 045705.

Fremy, S. and Kawai, S. and Pawlak, R. and Glatzel, T. and Baratoff, A. and Meyer, E.. (2012) Three-dimensional dynamic force spectroscopy measurements on KBr(001): atomic deformations at small tip-sample separations. Nanotechnology, Vol. 23, H. 5 , 055401.

Pawlak, R. and Kawai, S. and Fremy, S. and Glatzel, T. and Meyer, E.. (2012) High-resolution imaging of C-60 molecules using tuning-fork-based non-contact atomic force microscopy. Journal of physics. Condensed matter, Vol. 24, H. 8 , 084005.

Kawai, Shigeki and Hafizovic, Sadik and Glatzel, Thilo and Baratoff, Alexis and Meyer, Ernst. (2012) Rapid reconstruction of a strong nonlinear property by a multiple lock-in technique. Physical Review B, Vol. 85, H. 16 , 165426.

Wirtz, Tom and Fleming, Yves and Gerard, Mathieu and Gysin, Urs and Glatzel, Thilo and Meyer, Ernst and Wegmann, Urs and Maier, Urs and Odriozola, Aitziber Herrero and Uehli, Daniel. (2012) Design and performance of a combined secondary ion mass spectrometry-scanning probe microscopy instrument for high sensitivity and high-resolution elemental three-dimensional analysis. Review of scientific instruments, Vol. 83, H. 6 , 063702.

Pawlak, Remy and Fremy, Sweetlana and Kawai, Shigeki and Glatzel, Thilo and Fang, Hongjuan and Fendt, Leslie-Anne and Diederich, Francois and Meyer, Ernst. (2012) Directed Rotations of Single Porphyrin Molecules Controlled by Localized Force Spectroscopy. ACS nano, Vol. 6, H. 7. S. 6318-6324.

2011

Trevethan, Thomas and Such, Bartosz and Glatzel, Thilo and Kawai, Shigeki and Shluger, Alexander L. and Meyer, Ernst and de Mendoza, Paula and Echavarren, Antonio M.. (2011) Organic Molecules Reconstruct Nanostructures on Ionic Surfaces. Small, Vol. 7, H. 9. S. 1264-1270.

Kawai, Shigeki and Canova, Filippo Federici and Glatzel, Thilo and Foster, Adam S. and Meyer, Ernst. (2011) Atomic-scale dissipation processes in dynamic force spectroscopy. Physical Review B, Vol. 84, H. 11 , 115415.

Steiner, Pascal and Gnecco, Enrico and Krok, Franciszek and Budzioch, Janusz and Walczak, Lukasz and Konior, Jerzy and Szymonski, Marek and Meyer, Ernst. (2011) Atomic-Scale Friction on Stepped Surfaces of Ionic Crystals. Physical review letters, Vol. 106, H. 18 , 186104.

Gysin, Urs and Rast, Simon and Aste, Andreas and Speliotis, Thanassis and Werle, Christoph and Meyer, Ernst. (2011) Magnetic properties of nanomagnetic and biomagnetic systems analyzed using cantilever magnetometry. Nanotechnology, 22 (28). p. 285715.

Pawlak, Remy and Kawai, Shigeki and Fremy, Sweetlana and Glatzel, Thilo and Meyer, Ernst. (2011) Atomic-Scale Mechanical Properties of Orientated C(60) Molecules Revealed by Noncontact Atomic Force Microscopy. ACS nano, Vol. 5, H. 8. S. 6349-6354.

Kawai, Shigeki and Pawlak, Remy and Glatzel, Thilo and Meyer, Ernst. (2011) Systematic measurement of pentacene assembled on Cu(111) by bimodal dynamic force microscopy at room temperature. Physical Review B, Vol. 84, H. 8 , 085429.

Fessler, Gregor and Zimmermann, Iwan and Glatzel, Thilo and Gnecco, Enrico and Steiner, Pascal and Roth, Raphael and Keene, Tony D. and Liu, Shi-Xia and Decurtins, Silvio and Meyer, Ernst. (2011) Orientation dependent molecular friction on organic layer compound crystals. Applied physics letters, Vol. 98, H. 8 , 083119.

Gysin, U. and Rast, S. and Kisiel, M. and Werle, C. and Meyer, E.. (2011) Low temperature ultrahigh vacuum noncontact atomic force microscope in the pendulum geometry. Review of scientific instruments, Vol. 82, H. 2 , 023705.

Kisiel, Marcin and Gnecco, Enrico and Gysin, Urs and Marot, Laurent and Rast, Simon and Meyer, Ernst. (2011) Suppression of electronic friction on Nb films in the superconducting state. Nature materials, Vol. 10, H. 2. S. 119-122.

Kawai, Shigeki and Glatzel, Thilo and Koch, Sascha and Baratoff, Alexis and Meyer, Ernst. (2011) Interaction-induced atomic displacements revealed by drift-corrected dynamic force spectroscopy. Physical Review B, Vol. 83, H. 3 , 035421.

2010

Urbakh, Michael and Meyer, Ernst. (2010) Nanotribology : the renaissance of friction. Nature materials, Vol. 9, H. 1. S. 8-10.

Gross, L. and Schlittler, R. R. and Meyer, G. and Fendt, L. -A. and Diederich, F. and Glatzel, T. and Kawai, S. and Koch, S. and Meyer, E.. (2010) Contacting self-ordered molecular wires by nanostencil lithography. Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement, and phenomena, Vol. 28, H. 3 , C4D34-9.

Kawai, Shigeki and Glatzel, Thilo and Hug, Hans-Josef and Meyer, Ernst. (2010) Atomic contact potential variations of Si(111)-7 * 7 analyzed by Kelvin probe force microscopy. Nanotechnology, Vol. 21, H. 24 , 245704 (9 pp.).

Gnecco, E. and Rao, A. and Mougin, K. and Chandrasekar, G. and Meyer, E.. (2010) Controlled manipulation of rigid nanorods by atomic force microscopy. Nanotechnology, Vol. 21, H. 21 , 215702 (5 pp.).

Kawai, S. and Glatzel, T. and Koch, S. and Such, B. and Baratoff, A. and Meyer, E.. (2010) Ultrasensitive detection of lateral atomic-scale interactions on graphite (0001) via bimodal dynamic force measurements. Physical Review B, Vol. 81 , 085420. S. 085420.

Such, B. and Trevethan, T. and Glatzel, T. and Kawai, S. and Zimmerli, L. and Meyer, E. and Shluger, A. L. and Amijs, C. H. M. and de Mendoza, P. and Echavarren, A. M.. (2010) Functionalized Truxenes: Adsorption and Diffusion of Single Molecules on the KBr(001) Surface. ACS nano, Vol. 4 , S. 3429–3439.

Steiner, P. and Gnecco, E. and Filleter, T. and Gosvami, N. N. and Maier, S. and Meyer, E. and Bennewitz, R.. (2010) Atomic Friction Investigations on Ordered Superstructures. Tribology letters, Vol. 39, H. 3. S. 321-327.

Roth, R. and Glatzel, T. and Steiner, P. and Gnecco, E. and Baratoff, A. and Meyer, E.. (2010) Multiple Slips in Atomic-Scale Friction: An Indicator for the Lateral Contact Damping. Tribology letters, Vol. 39. S. 63-69.

Such, B. and Glatzel, T. and Kawai, S. and Koch, S. and Meyer, E.. (2010) Three-dimensional force spectroscopy of KBr(001) by tuning fork-based cryogenic noncontact atomic force microscopy. Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement, and phenomena, Vol. 28, H. 3 , C4B1-C4B5.

Marot, L. and Schoch, R. and Steiner, R. and Thommen, V. and Mathys, D. and Meyer, E.. (2010) Rhodium and silicon system: II. Rhodium silicide formation. Nanotechnology, Vol. 21, H. 36 , 365707.

Marot, L. and Schoch, R. and Steiner, R. and Meyer, E.. (2010) Rhodium and silicon system: I. Glassy metallic alloy formation. Nanotechnology, Vol. 21, H. 36 , 365706.

Gulseren, O. and Manini, N. and Meyer, E. and Tosatti, E. and Urbakh, M. and Vanossi, A.. (2010) New Trends in Nanotribology. Tribology letters, Vol. 39, H. 3. S. 227.

Steiner, Pascal and Roth, Raphael and Gnecco, Enrico and Baratoff, Alexis and Meyer, Ernst. (2010) Angular dependence of static and kinetic friction on alkali halide surfaces. Physical Review B, Vol. 82, H. 20. S. 205417.

2009

Rao, Akshata and Wille, Marie-Luise and Gnecco, Enrico and Mougin, Karine and Meyer, Ernst. (2009) Trajectory fluctuations accompanying the manipulation of spherical nanoparticles. Physical Review B, Vol. 80, H. 19 , 193405, 4 S..

Rast, S. and Gysin, U. and Meyer, E.. (2009) Phase noise induced due to amplitude fluctuations in dynamic force microscopy. Physical Review B, Vol. 79, H. 5 , 054106, 6 S..

Steiner, Pascal and Roth, Raphael and Gnecco, Enrico and Baratoff, Alexis and Maier, Sabine and Glatzel, Thilo and Meyer, Ernst. (2009) Two-dimensional simulation of superlubricity on NaCl and highly oriented pyrolytic graphite. Physical Review B, Vol. 79, H. 4 , 045414, 9 S..

Kawai, Shigeki and Glatzel, Thilo and Koch, Sascha and Such, Bartosz and Baratoff, Alexis and Meyer, Ernst. (2009) Time-averaged cantilever deflection in dynamic force spectroscopy. Physical Review B, Vol. 80, H. 8 , 085422, 7 S..

Kawai, Shigeki and Glatzel, Thilo and Koch, Sascha and Such, Bartosz and Baratoff, Alexis and Meyer, Ernst. (2009) Systematic achievement of improved atomic-scale contrast via bimodal dynamic force microscopy. Physical review letters, Vol. 103, H. 22 , 220801, 4 S..

Glatzel, Th. and Zimmerli, L. and Koch, S. and Kawai, S. and Meyer, E.. (2009) Molecular assemblies grown between metallic contacts on insulating surfaces. Applied physics letters, Vol. 94, H. 6 , 063303, 3 S..

Kawai, S. and Maier, S. and Glatzel, Th. and Koch, S. and Such, B. and Zimmerli, L. and Fendt, L. -A. and Diederich, F. and Meyer, E.. (2009) Cutting and self-healing molecular wires studied by dynamic force microscopy. Applied physics letters, Vol. 95, H. 10 , 103109, 3 S..

Meyer, Ernst and Glatzel, Thilo. (2009) Novel probes for molecular electronics. Science, Vol. 324, H. 5933. S. 1397-1398.

Steiner, Pascal and Roth, Raphael and Gnecco, Enrico and Glatzel, Thilo and Baratoff, Alexis and Meyer, Ernst. (2009) Modulation of contact resonance frequency accompanying atomic-scale stick-slip in friction force microscopy. Nanotechnology, Vol. 20, H. 49 , 495701, 6 S..

Rao, A. and Gnecco, E. and Marchetto, D. and Mougin, K. and Schoenenberger, M. and Valeri, S. and Meyer, E.. (2009) The analytical relations between particles and probe trajectories in atomic force microscope nanomanipulation. Nanotechnology, Vol. 20, H. 11 , 115706, 6 S..

Gnecco, E. and Socoliuc, A. and Maier, S. and Gessler, J. and Glatzel, T. and Baratoff, A. and Meyer, E.. (2009) Dynamic superlubricity on insulating and conductive surfaces in ultra-high vacuum and ambient environment. Nanotechnology, Vol. 20, H. 2 , 025501, 7 S..

Glatzel, Th and Zimmerli, L. and Koch, S. and Such, B. and Kawai, S. and Meyer, E.. (2009) Determination of effective tip geometries in Kelvin probe force microscopy on thin insulating films on metals. Nanotechnology, Vol. 20, H. 26 , 264016, 7 S..

2008

Maier, S. and Gnecco, E. and Baratoff, A. and Bennewitz, R. and Meyer, E.. (2008) Atomic-scale friction modulated by a buried interface : combined atomic and friction force microscopy experiments. Physical Review B, Vol. 78, H. 4 , 045432, 5 S..

Ghasemi, S. Alireza and Goedecker, Stefan and Baratoff, Alexis and Lenosky, Thomas and Meyer, Ernst and Hug, Hans J.. (2008) Ubiquitous mechanisms of energy dissipation in noncontact atomic force microscopy. Physical review letters, Vol. 100, H. 23 , 236106, 4 S..

Mougin, K. and Gnecco, E. and Rao, A. and Cuberes, M. T. and Jayararnan, S. and McFarland, E. W. and Haidara, H. and Meyer, E.. (2008) Manipulation of gold nanoparticles : influence of surface chemistry, temperature, and environment (vacuum versus ambient atmosphere). Langmuir, Vol. 24, H. 4. S. 1577-1581.

Gnecco, Enrico and Maier, Sabine and Meyer, Ernst. (2008) Superlubricity of dry nanocontacts. Journal of physics. Condensed matter, Vol. 20, H. 35 , 354004, 5 S..

Lee, Dong-Weon and Wetzel, Adrian and Meyer, Ernst. (2008) Functional microcantilever for a novel scanning force microscope. Journal of the Korean Physical Society, Vol. 52, H. 5. S. 1496-1500.

Maier, Sabine and Fendt, Leslie-Anne and Zimmerli, Lars and Glatzel, Thilo and Pfeiffer, Oliver F. and Diederich, Francois and Meyer, Ernst. (2008) Nanoscale engineering of molecular porphyrin wires on insulating surfaces. Small, Vol. 4, H. 8. S. 1115-1118.

Glatzel, Thilo and Zimmerli, Lars and Meyer, Ernst. (2008) Molecular assemblies on insulating ultrathin films analyzed by nc-AFM and KPFM. Israel Journal of Chemistry, Vol. 48, H. 2. S. 107-116.

Bistac, Sophie and Schmitt, Marjorie and Ghorbal, Achraf and Gnecco, Enrico and Meyer, Ernst. (2008) Nano-scale friction of polystyrene in air and in vacuum. Polymer, Vol. 49, H. 17. S. 3780-3784.

2007

Maier, S. and Pfeiffer, O. and Glatzel, Th. and Meyer, E. and Filleter, T. and Bennewitz, R.. (2007) Asymmetry in the reciprocal epitaxy of NaCl and KBr. Physical Review B, Vol. 75, H. 19 , 195408, 7 S..

Dorrestijn, M. and Bietsch, A. and Acikalin, T. and Raman, A. and Hegner, M. and Meyer, E. and Gerber, Ch.. (2007) Chladni figures revisited based on nanomechanics. Physical review letters, Vol. 98, H. 2 , 026102, 4 S..

Wyder, U. and Baratoff, A. and Meyer, E. and Kantorovich, L. N. and David, J. and Maier, S. and Filleter, T. and Bennewitz, R.. (2007) Interpretation of atomic friction experiments based on atomistic simulations. Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement, and phenomena, Vol. 25, H. 5. S. 1547-1553.

Kawai, Yusuke and Ono, Takahito and Esashi, Masayoshi and Meyer, Ernst and Gerber, Christoph. (2007) Resonator combined with a piezoelectric actuator for chemical analysis by force microscopy. Review of scientific instruments, Vol. 78, H. 6 , 063709, 4 S..

Meyer, Ernst and Rast, Simon. (2007) Force microscopy : Magnetic tips probe the nanoworld. Nature nanotechnology, Vol. 2, H. 5. S. 267-268.

Meyer, Ernst and Gnecco, Enrico. (2007) Nanofriction : skating on hot surfaces. Nature materials, Vol. 6, H. 3. S. 180-181.

2006

Socoliuc, Anisoara and Gnecco, Enrico and Maier, Sabine and Pfeiffer, Oliver and Baratoff, Alexis and Bennewitz, Roland and Meyer, Ernst. (2006) Atomic-scale control of friction by actuation of nanometer-sized contacts. Science, Vol. 313, H. 5784. S. 207-210.

Dorrestijn, M. and Bietsch, A. and Gerber, C. and Meyer, E.. (2006) A tunnelling displacement sensor based on a squeezable molecular bilayer. Nanotechnology, Vol. 17, H. 9. S. 2242-2245.

Rast, S. and Gysin, U. and Ruff, P. and Gerber, C. and Meyer, E. and Lee, D. W.. (2006) Force microscopy experiments with ultrasensitive cantilevers. Nanotechnology, Vol. 17, H. 7, Sp. Iss. SI , S189-S194.

Giorgio, M. and Meier, B. and Magin, R. and Meyer, E.. (2006) Magnetic damping losses of tipped cantilevers. Nanotechnology, Vol. 17, H. 3. S. 871-880.

2005

Maier, S. and Sang, Y. and Filleter, T. and Grant, M. and Bennewitz, R. and Gnecco, E. and Meyer, E.. (2005) Fluctuations and jump dynamics in atomic friction experiments. Physical Review B, Vol. 72, H. 24 , 245418, 9 S..

Wetzel, A. and Socoliuc, A. and Meyer, E. and Bennewitz, R. and Gnecco, E. and Gerber, C.. (2005) A versatile instrument for in situ combination of scanning probe microscopy and time-of-flight mass spectrometry. Review of scientific instruments, Vol. 76, H. 10 , 103701, 6 S..

Lee, D. W. and Kang, J. H. and Gysin, U. and Rast, S. and Meyer, E. and Despont, M. and Gerber, C.. (2005) Fabrication and evaluation of single-crystal silicon cantilevers with ultra-low spring constants. Journal of micromechanics and microengineering, Vol. 15, H. 11. S. 2179-2183.

2004

Lucas, Marcel and Riedo, Elisa. (2004) Scanning probe Microscopy in materials science. MRS bulletin : a publication of the Materials Research Society, Vol. 29, no. 7. S. 443-448.

Socoliuc, A. and Bennewitz, R. and Gnecco, E. and Meyer, E.. (2004) Transition from stick-slip to continuous sliding in atomic friction : entering a new regime of ultralow friction. Physical review letters, Vol. 92, H. 13 , 134301, 4 S..

Bennewitz, R. and Schar, S. and Gnecco, E. and Pfeiffer, O. and Bammerlin, M. and Meyer, E.. (2004) Atomic structure of alkali halide surfaces. Applied physics. A, Materials science & processing, Vol. 78, H. 6. S. 837-841.

Gnecco, E. and Riedo, E. and Bennewitz, R. and Meyer, E. and Brune, H.. (2004) Thermally activated phenomena observed by atomic force microscopy. In: Dynamics in small confining systems - 2003, Materials Research Society symposium proceedings ; 790. Warrendale, Pa., S. 271-274.

Bennewitz, R. and Gnecco, E. and Socoliuc, A. and Wyder, U. and Meyer, E.. (2004) Atomic friction and wear. Abstracts of papers / American Chemical Society, Vol. 227, Part 1 , 060-COLL.

Pfeiffer, O. and Nony, L. and Bennewitz, R. and Baratoff, A. and Meyer, E.. (2004) Distance dependence of force and dissipation in non-contact atomic force microscopy on Cu(100) and Al(111). Nanotechnology, Vol. 15, H. 2, Sp. Iss. SI , S101-S107.

Nony, L. and Bennewitz, R. and Pfeiffer, O. and Gnecco, E. and Baratoff, A. and Meyer, E. and Eguchi, T. and Gourdon, A. and Joachim, C.. (2004) Cu-TBPP and PTCDA molecules on insulating surfaces studied by ultra-high-vacuum non-contact AFM. Nanotechnology, Vol. 15, H. 2, Sp. Iss. SI , S91-S96.

Lee, D. and Wetzel, A. and Bennewitz, R. and Meyer, E. and Despont, M. and Vettiger, P. and Gerber, C.. (2004) Switchable cantilever for a time-of-flight scanning force microscope. Applied physics letters, Vol. 84, H. 9. S. 1558-1560.

2003

Socoliuc, A. and Gnecco, E. and Bennewitz, R. and Meyer, E.. (2003) Ripple formation induced in localized abrasion. Physical Review B, Vol. 68, H. 11 , 115416, 4 S..

Riedo, E. and Gnecco, E. and Bennewitz, R. and Meyer, E. and Brune, H.. (2003) Interaction potential and hopping dynamics governing sliding friction. Physical review letters, Vol. 91, H. 8 , 084502, 4 S..

Loppacher, C. and Guggisberg, M. and Pfeiffer, O. and Meyer, E. and Bammerlin, M. and Luthi, R. and Schlittler, R. and Gimzewski, J. K. and Tang, H. and Joachim, C.. (2003) Direct determination of the energy required to operate a single molecule switch. Physical review letters, Vol. 90, H. 6 , 066107, 4 S..

Schar, S. and Bennewitz, R. and Eguchi, T. and Gnecco, E. and Pfeiffer, O. and Nony, L. and Meyer, E.. (2003) The Cu(100)-c(2 x 2) N structure studied by combined nc-AFM/STM. Applied surface science, Vol. 210, H. 1-2. S. 43-48.

Bennewitz, R. and Schar, S. and Gnecco, E. and Pfeiffer, O. and Bammerlin, M. and Meyer, E.. (2003) Atomic structure of alkali halide surfaces. In: Festkörperprobleme, Bd. 43. Braunschweig, S. 477-485.

Lee, D. W. and Despont, M. and Drechsler, U. and Gerber, C. and Vettiger, P. and Wetzel, A. and Bennewitz, R. and Meyer, E.. (2003) Switchable cantilever fabrication for a novel time-of-flight scanning force microscope. Microelectronic engineering, Vol. 67-68. S. 635-643.

Gnecco, E. and Bennewitz, R. and Socoliuc, A. and Meyer, E.. (2003) Friction and wear on the atomic scale. Wear, Vol. 254, H. 9. S. 859-862.

Arntz, Y. and Seelig, J. D. and Lang, H. P. and Zhang, J. and Hunziker, P. and Ramseyer, J. P. and Meyer, E. and Hegner, M. and Gerber, C.. (2003) Label-free protein assay based on a nanomechanical cantilever array. Nanotechnology, Vol. 14, H. 1. S. 86-90.

2002

McKendry, R. and Zhang, J. Y. and Arntz, Y. and Strunz, T. and Hegner, M. and Lang, H. P. and Baller, M. K. and Certa, U. and Meyer, E. and Guntherodt, H. J. and Gerber, C.. (2002) Multiple label-free biodetection and quantitative DNA-binding assays on a nanomechanical cantilever array. Proceedings of the National Academy of Sciences of the United States of America, Vol. 99, No. 15. S. 9783-9788.

Pfeiffer, O. and Bennewitz, R. and Baratoff, A. and Meyer, E. and Grutter, P.. (2002) Lateral-force measurements in dynamic force microscopy. Physical Review B, Vol. 65, H. 16 , 0161403, 4 S..

Gnecco, E. and Bennewitz, R. and Meyer, E.. (2002) Abrasive wear on the atomic scale. Physical review letters, Vol. 88, H. 21 , 215501, 4 S..

Bennewitz, R. and Pfeiffer, O. and Schar, S. and Barwich, V. and Meyer, E. and Kantorovich, L. N.. (2002) Atomic corrugation in nc-AFM of alkali halides. Applied surface science, Vol. 188, H. 3-4. S. 232-237.

Gnecco, E. and Bennewitz, R. and Meyer, E.. (2002) Nanotribology. Chimia, Vol. 56, H. 10. S. 562-565.

Meyer, E. and Bennewitz, R. and Gnecco, E. and Pfeiffer, O. and Barwich, V. and Wetzel, A. and Baratoff, A.. (2002) From contact to non-contact : force microscopy experiments in ultrahigh vacuum. Abstracts of papers / American Chemical Society, Vol. 223, Part 2 , 497-PHYS.

Lang, H. P. and Hegner, M. and Meyer, E. and Gerber, C.. (2002) Nanomechanics from atomic resolution to molecular recognition based on atomic force microscopy technology. Nanotechnology, Vol. 13, H. 5 , R29-R36.

2001

Bennewitz, R. and Schar, S. and Barwich, V. and Pfeiffer, O. and Meyer, E. and Krok, F. and Such, B. and Kolodzej, J. and Szymonski, M.. (2001) Atomic-resolution images of radiation damage in KBr. Surface science, Vol. 474, H. 1-3 , S. L197-L202.

Baumeister, B. and Jung, T. A. and Meyer, E.. (2001) Nanoscale fracture studies using the scanning force microscope. Applied physics letters, Vol. 78, H. 17. S. 2485-2487.

Meyer, E. and Bennewitz, R. and Pfeiffer, O. and Barwich, V. and Guggisberg, M. and Schar, S. and Bammerlin, M. and Loppacher, C. and Gysin, U. and Wattinger, C. and Baratoff, A.. (2001) Dissipation mechanisms studied by dynamic force microscopies. In: Fundamentals of tribology and bridging the gap between the macro- and micro-nanoscales (NATO science series II, Mathematics, physics and chemistry, Vol. 10). Dordrecht, S. 67-81.

Bennewitz, R. and Meyer, E. and Bammerlin, M. and Gyalog, T. and Gnecco, E.. (2001) Atomic-scale stick slip. In: Fundamentals of tribology and bridging the gap between the macro- and micro-nanoscales (NATO science series II, Mathematics, physics and chemistry, Vol. 10). Dordrecht, S. 53-66.

Guggisberg, M. and Pfeiffer, O. and Schaer, S. and Barwich, V. and Bammerlin, M. and Loppacher, C. and Bennewitz, R. and Baratoff, A. and Meyer, E.. (2001) Contrast inversion in nc-AFM on Si(111)7 x 7 due to short-range electrostatic interactions. Applied physics. A, Materials science & processing, Vol. 72, Suppl. 1 , S19-S22.

Loppacher, Ch. and Bammerlin, M. and Guggisberg, M. and Meyer, E. and Guentherodt, H. -J. and Luethi, R. and Schlittler, R. and Gimzewski, K.. (2001) Forces with submolecular resolution between the probing tip and Cu-TBPP molecules on Cu(100) observed with a combined AFM/STM. Applied physics. A, Materials science & processing, Vol. 72, Suppl. 1 , S105-S108.

Baumeister, B. and Jung, T. A. and Meyer, E.. (2001) Tribological studies on fracture and erosion of nanostructures. Tribology letters, Vol. 11, H. 2. S. 107-110.

Bennewitz, R. and Gnecco, E. and Gyalog, T. and Meyer, E.. (2001) Atomic friction studies on well-defined surfaces. Tribology letters, Vol. 10, H. 1-2. S. 51-56.

Gnecco, E. and Bennewitz, R. and Gyalog, T. and Meyer, E.. (2001) Friction experiments on the nanometre scale. Journal of physics. Condensed matter, Vol. 13, H. 31 , R619-R642.

Battiston, F. M. and Ramseyer, J. P. and Lang, H. P. and Baller, M. K. and Gerber, C. and Gimzewski, J. K. and Meyer, E. and Guntherodt, H. J.. (2001) A chemical sensor based on a microfabricated cantilever array with simultaneous resonance-frequency and bending readout. Sensors and actuators. B, Chemical, Vol. 77, H. 1-2. S. 122-131.

2000

Guggisberg, M. and Bammerlin, M. and Loppacher, C. and Pfeiffer, O. and Abdurixit, A. and Barwich, V. and Bennewitz, R. and Baratoff, A. and Meyer, E. and Guntherodt, H. J.. (2000) Separation of interactions by noncontact force microscopy. Physical Review B, Vol. 61, H. 16. S. 11151-11155.

Bennewitz, R. and Foster, A. S. and Kantorovich, L. N. and Bammerlin, M. and Loppacher, C. and Schar, S. and Guggisberg, M. and Meyer, E. and Shluger, A. L.. (2000) Atomically resolved edges and kinks of NaCl islands on Cu(111) : experiment and theory. Physical Review B, Vol. 62, H. 3. S. 2074-2084.

Loppacher, C. and Bennewitz, R. and Pfeiffer, O. and Guggisberg, M. and Bammerlin, M. and Schar, S. and Barwich, V. and Baratoff, A. and Meyer, E.. (2000) Experimental aspects of dissipation force microscopy. Physical Review B, Vol. 62, H. 20. S. 13674-13679.

Loppacher, C. and Bammerlin, M. and Guggisberg, M. and Schar, S. and Bennewitz, R. and Baratoff, A. and Meyer, E. and Guntherodt, H. J.. (2000) Dynamic force microscopy of copper surfaces : atomic resolution and distance dependence of tip-sample interaction and tunneling current. Physical Review B, Vol. 62, H. 24. S. 16944-16949.

Gnecco, E. and Bennewitz, R. and Gyalog, T. and Loppacher, C. and Bammerlin, M. and Meyer, E. and Guntherodt, H. J.. (2000) Velocity dependence of atomic friction. Physical review letters, Vol. 84, H. 6. S. 1172-1175.

Guggisberg, M. and Bammerlin, M. and Baratoff, A. and Luthi, R. and Loppacher, C. and Battiston, F. M. and Lu, J. and Bennewitz, R. and Meyer, E. and Guntherodt, H. J.. (2000) Dynamic force microscopy across steps on the Si(111)-(7 x 7) surface. Surface science, Vol. 461, H. 1-3. S. 255-265.

Barwich, V. and Bammerlin, M. and Baratoff, A. and Bennewitz, R. and Guggisberg, M. and Loppacher, C. and Pfeiffer, O. and Meyer, E. and Guntherodt, H. J. and Salvetat, J. P. and Bonard, J. M. and Forro, L.. (2000) Carbon nanotubes as tips in non-contact SFM. Applied surface science, Vol. 157, H. 4. S. 269-273.

Abdurixit, A. and Baratoff, A. and Meyer, E.. (2000) Molecular dynamics simulations of dynamic force microscopy : applications to the Si(111)-7 X 7 surface. Applied surface science, Vol. 157, H. 4. S. 355-360.

Pfeiffer, O. and Loppacher, C. and Wattinger, C. and Bammerlin, M. and Gysin, U. and Guggisberg, M. and Rast, S. and Bennewitz, R. and Meyer, E. and Guntherodt, H. J.. (2000) Using higher flexural modes in non-contact force microscopy. Applied surface science, Vol. 157, H. 4. S. 337-342.

Fritz, J. and Baller, M. K. and Lang, H. P. and Strunz, T. and Meyer, E. and Guntherodt, H. J. and Delamarche, E. and Gerber, C. and Gimzewski, J. K.. (2000) Stress at the solid-liquid interface of self-assembled monolayers on gold investigated with a nanomechanical sensor. Langmuir, Vol. 16, H. 25. S. 9694-9696.

Fabian, J. H. and Scandella, L. and Fuhrmann, H. and Berger, R. and Mezzacasa, T. and Musil, C. and Gobrecht, J. and Meyer, E.. (2000) Finite element calculations and fabrication of cantilever sensors for nanoscale detection. Ultramicroscopy, Vol. 82, H. 1-4. S. 69-77.

Baller, M. K. and Lang, H. P. and Fritz, J. and Gerber, C. and Gimzewski, J. K. and Drechsler, U. and Rothuizen, H. and Despont, M. and Vettiger, P. and Battiston, F. M. and Ramseyer, J. P. and Fornaro, P. and Meyer, E. and Guntherodt, H. J.. (2000) A cantilever array-based artificial nose. Ultramicroscopy, Vol. 82, H. 1-4. S. 1-9.

Rast, S. and Wattinger, C. and Gysin, U. and Meyer, E.. (2000) Dynamics of damped cantilevers. Review of scientific instruments, Vol. 71, H. 7. S. 2772-2775.

Fritz, J. and Baller, M. K. and Lang, H. P. and Rothuizen, H. and Vettiger, P. and Meyer, E. and Guntherodt, H. J. and Gerber, C. and Gimzewski, J. K.. (2000) Translating biomolecular recognition into nanomechanics. Science, Vol. 288, H. 5464. S. 316-318.

Rast, S. and Wattinger, C. and Gysin, U. and Meyer, E.. (2000) The noise of cantilevers. Nanotechnology, Vol. 11, H. 3. S. 169-172.

1999

Bennewitz, R. and Gyalog, T. and Guggisberg, M. and Bammerlin, M. and Meyer, E. and Guntherodt, H. J.. (1999) Atomic-scale stick-slip processes on Cu(111). Physical Review B, Vol. 60, H. 16. S. 11301-11304.

Bennewitz, R. and Barwich, V. and Bammerlin, M. and Loppacher, C. and Guggisberg, R. and Baratoff, A. and Meyer, E. and Guntherodt, H. J.. (1999) Ultrathin films of NaCl on Cu(111) : a LEED and dynamic force microscopy study. Surface science, Vol. 438, H. 1-3. S. 289-296.

Eng, L. M. and Bammerlin, M. and Loppacher, C. and Guggisberg, M. and Bennewitz, R. and Luthi, R. and Meyer, E. and Guntherodt, H. J.. (1999) Surface morphology, chemical contrast, and ferroelectric domains in TGS bulk single crystals differentiated with UHV non-contact force microscopy. Applied surface science, Vol. 140, H. 3-4. S. 253-258.

Bennewitz, R. and Bammerlin, M. and Loppacher, C. and Guggisberg, M. and Eng, L. and Meyer, E. and Guntherodt, H. J. and An, C. P. and Luty, F.. (1999) Molecular impurities at the NaCl(100) surface observed by scanning force microscopy. Radiation effects and defects in solids, Vol. 150, H. 1-4. S. 321-326.

Bennewitz, R. and Bammerlin, M. and Guggisberg, M. and Loppacher, C. and Baratoff, A. and Meyer, E. and Guntherodt, H. J.. (1999) Aspects of dynamic force microscopy on NaCl/Cu(111) : resolution, tip-sample interactions and cantilever oscillation characteristics. Surface and interface analysis, Vol. 27, H. 5-6. S. 462-466.

Lu, J. and Eng, L. and Bennewitz, R. and Meyer, E. and Guntherodt, H. J. and Delamarche, E. and Scandella, L.. (1999) Surface potential studies of self-assembling monolayers using Kelvin probe force microscopy. Surface and interface analysis, Vol. 27, H. 5-6. S. 368-373.

Eng, L. M. and Bammerlin, M. and Loppacher, C. and Guggisberg, M. and Bennewitz, R. and Meyer, E. and Guntherodt, H. J.. (1999) Ferroelectric domains and material contrast down to a 5 nm lateral resolution on uniaxial ferroelectric triglycine sulphate crystals. Surface and interface analysis, Vol. 27, H. 5-6. S. 422-425.

Loppacher, C. and Bammerlin, M. and Guggisberg, M. and Battiston, F. and Bennewitz, R. and Rast, S. and Baratoff, A. and Meyer, E. and Guntherodt, H. J.. (1999) Phase variation experiments in non-contact dynamic force microscopy using phase locked loop techniques. Applied surface science, Vol. 140, H. 3-4. S. 287-292.

Lang, H. P. and Baller, M. K. and Berger, R. and Gerber, C. and Gimzewski, J. K. and Battiston, F. M. and Fornaro, P. and Ramseyer, J. P. and Meyer, E. and Guntherodt, H. J.. (1999) An artificial nose based on a micromechanical cantilever array. Analytica chimica acta, Vol. 393, H. 1-3. S. 59-65.

Eng, L. M. and Bammerlin, M. and Loppacher, C. and Guggisberg, M. and Bennewitz, R. and Luthi, R. and Meyer, E. and Huser, T. and Heinzelmann, H. and Guntherodt, H. J.. (1999) Ferroelectric domain characterisation and manipulation: a challenge for scanning probe microscopy. Ferroelectrics, Vol. 222, H. 1-4. S. 411-420.

Lu, J. and Delamarche, E. and Eng, L. and Bennewitz, R. and Meyer, E. and Guntherodt, H. J.. (1999) Kelvin probe force microscopy on surfaces: Investigation of the surface potential of self-assembled monolayers on gold. Langmuir, Vol. 15, H. 23. S. 8184-8188.

1998

Meyer, E. and Hug, H. J. and Luthi, R. and Stiefel, B. and Guntherodt, H. J.. (1998) Forces in scanning probe microscopy. In: Nanoscale science and technology. Dordrecht [etc.], S. 23-39.

Battiston, F. M. and Bammerlin, M. and Loppacher, C. and Luthi, R. and Meyer, E. and Guntherodt, H. J. and Eggimann, F.. (1998) Fuzzy controlled feedback applied to a combined scanning tunneling and force microscope. Applied physics letters, Vol. 72, H. 1. S. 25-27.

Berger, R. and Lang, H. P. and Gerber, C. and Gimzewski, J. K. and Fabian, J. H. and Scandella, L. and Meyer, E. and Guntherodt, H. J.. (1998) Micromechanical thermogravimetry. Chemical Physics Letters, Vol. 294, H. 4-5. S. 363-369.

Lang, H. P. and Berger, R. and Andreoli, C. and Brugger, J. and Despont, M. and Vettiger, P. and Gerber, C. and Gimzewski, J. K. and Ramseyer, J. P. and Meyer, E. and Guntherodt, H. J.. (1998) Sequential position readout from arrays of micromechanical cantilever sensors. Applied physics letters, Vol. 72, H. 3. S. 383-385.

Battiston, F. M. and Bammerlin, M. and Loppacher, C. and Guggisberg, M. and Luthi, R. and Meyer, E. and Eggimann, F. and Guntherodt, H. J.. (1998) Combined scanning tunneling and force microscope with fuzzy controlled feedback. Applied physics. A, Materials science & processing, Vol. 66, Part 1 Suppl. S , S49-S53.

Berger, R. and Delamarche, E. and Lang, H. P. and Gerber, C. and Gimzewski, J. K. and Meyer, E. and Guntherodt, H. J.. (1998) Surface stress in the self-assembly of alkanethiols on gold probed by a force microscopy technique. Applied physics. A, Materials science & processing, Vol. 66, Part 1 Suppl. S , S55-S59.

Lang, H. P. and Berger, R. and Battiston, F. and Ramseyer, J. P. and Meyer, E. and Andreoli, C. and Brugger, J. and Vettiger, P. and Despont, M. and Mezzacasa, T. and Scandella, L. and Guntherodt, H. J. and Gerber, C. and Gimzewski, J. K.. (1998) A chemical sensor based on a micromechanical cantilever array for the identification of gases and vapors. Applied physics. A, Materials science & processing, Vol. 66, Part 1 Suppl. S , S61-S64.

Guggisberg, M. and Bammerlin, M. and Luthi, R. and Loppacher, C. and Battiston, F. and Lu, J. and Baratoff, A. and Meyer, E. and Guntherodt, H. J.. (1998) Comparison of dynamic lever STM and noncontact AFM. Applied physics. A, Materials science & processing, Vol. 66, Part 1 Suppl. S , S245-S248.

Loppacher, C. and Bammerlin, M. and Battiston, F. and Guggisberg, M. and Muller, D. and Hidber, H. R. and Luthi, R. and Meyer, E. and Guntherodt, H. J.. (1998) Fast digital electronics for application in dynamic force microscopy using high-Q cantilevers. Applied physics. A, Materials science & processing, Vol. 66, Part 1 Suppl. S , S215-S218.

Lu, J. and Guggisberg, M. and Luthi, R. and Kubon, M. and Scandella, L. and Gerber, C. and Meyer, E. and Guntherodt, H. J.. (1998) Surface potential studies using Kelvin force spectroscopy. Applied physics. A, Materials science & processing, Vol. 66, Part 1 Suppl. S , S273-S275.

Bammerlin, M. and Luthi, R. and Meyer, E. and Baratoff, A. and Lu, J. and Guggisberg, M. and Loppacher, C. and Gerber, C. and Guntherodt, H. J.. (1998) Dynamic SFM with true atomic resolution on alkali halide surfaces. Applied physics. A, Materials science & processing, Vol. 66, Part 1 Suppl. S , S293-S294.

Streckeisen, P. and Rast, S. and Wattinger, C. and Meyer, E. and Vettiger, P. and Gerber, C. and Guntherodt, H. J.. (1998) Instrumental aspects of magnetic resonance force microscopy. Applied physics. A, Materials science & processing, Vol. 66, Part 1 Suppl. S , S341-S344.

Scandella, L. and Fabian, J. H. and Von Scala, C. and Berger, R. and Lang, H. P. and Gerber, C. and Gimzewski, J. K. and Meyer, E.. (1998) Micromechanical thermal gravimetry performed on one single zeolite crystal. Helvetica physica acta, Vol. 71, Suppl. 1. S. 3-4.

1997

Meyer, E. and Luthi, R. and Howald, L. and Bammerlin, M.. (1997) Instrumental aspects and contrast mechanisms of friction force microscopy. In: Micro/nanotribology and its applications. Dordrecht [etc.], S. 193-215.

Berger, R. and Delamarche, E. and Lang, H. P. and Gerber, C. and Gimzewski, J. K. and Meyer, E. and Guntherodt, H. J.. (1997) Surface stress in the self-assembly of alkanethiols on gold. Science, Vol. 276, H. 5321. S. 2021-2024.

Luthi, R. and Meyer, E. and Bammerlin, M. and Baratoff, A. and Howald, L. and Gerber, C. and Guntherodt, H. J.. (1997) Ultrahigh vacuum atomic force microscopy : true atomic resolution. Surface review and letters, Vol. 4, H. 5. S. 1025-1029.

1996

Meyer, E. and Luthi, R. and Howald, L. and Bammerlin, M. and Guggisberg, M. and Guntherodt, H. J. and Scandella, L. and Gobrecht, J. and Schumacher, A. and Prins, R.. (1996) Friction force spectroscopy. In: Physics of sliding friction. Dordrecht [etc.], S. 349-367.

Luthi, R. and Meyer, E. and Bammerlin, M. and Baratoff, A. and Lehmann, T. and Howald, L. and Gerber, C. and Guntherodt, H. J.. (1996) Atomic resolution in dynamic force microscopy across steps on Si(111)7 x 7. Zeitschrift für Physik. B, Condensed matter, Vol. 100, H. 2. S. 165-167.

Gutmannsbauer, W. and Hug, H. J. and Meyer, E.. (1996) Scanning probe microscopy for nanometer inspections and industrial applications. Microelectronic engineering, Vol. 32, H. 1-4. S. 389-409.

Meyer, E. and Luthi, R. and Howald, L. and Gutmannsbauer, W. and Haefke, H. and Guntherodt, H. J.. (1996) Friction force microscopy on well defined surfaces. Nanotechnology, Vol. 7, H. 4. S. 340-344.

Luthi, R. and Meyer, E. and Bammerlin, M. and Howald, L. and Haefke, H. and Lehmann, T. and Loppacher, C. and Guntherodt, H. J. and Gyalog, T. and Thomas, H.. (1996) Friction on the atomic scale : an ultrahigh vacuum atomic force microscopy study on ionic crystals. Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement, and phenomena, Vol. 14, H. 2. S. 1280-1284.

Meyer, E. and Luthi, R. and Howald, L. and Bammerlin, M. and Guggisberg, M. and Guntherodt, H. J.. (1996) Site-specific friction force spectroscopy. Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement, and phenomena, Vol. 14, H. 2. S. 1285-1288.

Scandella, L. and Meyer, E. and Howald, L. and Luthi, R. and Guggisberg, M. and Gobrecht, J. and Guntherodt, H. J.. (1996) Friction forces on hydrogen passivated (110) silicon and silicon dioxide studied by scanning force microscopy. Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement, and phenomena, Vol. 14, H. 2. S. 1255-1258.

Schumacher, A. and Kruse, N. and Prins, R. and Meyer, E. and Luthi, R. and Howald, L. and Guntherodt, H. J. and Scandella, L.. (1996) Influence of humidity on friction measurements of supported MoS2 single layers. Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement, and phenomena, Vol. 14, H. 2. S. 1264-1267.

Berger, R. and Gerber, C. and Gimzewski, J. K. and Meyer, E. and Guntherodt, H. J.. (1996) Thermal analysis using a micromechanical calorimeter. Applied physics letters, Vol. 69, H. 1. S. 40-42.

1995

Meyer, E. and Luthi, R. and Howald, L. and Guntherodt, H. J.. (1995) Friction force microscopy. In: Forces in scanning probe methods. Dordrecht [etc.], S. 285-306.

Luthi, R. and Meyer, E. and Haefke, H. and Howald, L. and Gutmannsbauer, W. and Guggisberg, M. and Bammerlin, M. and Guntherodt, H. J.. (1995) Nanotribology : an UHV-SFM study on thin-films of C60 and AgBr. Surface science, Vol. 338, H. 1-3. S. 247-260.

Howald, L. and Luthi, R. and Meyer, E. and Guntherodt, H. J.. (1995) Atomic-force microscopy on the Si(111) 7x7 surface. Physical Review B, Vol. 51, H. 8. S. 5484-5487.

Gyalog, T. and Bammerlin, M. and Luthi, R. and Meyer, E. and Thomas, H.. (1995) Mechanism of Atomic Friction. Europhysics Letters, Vol. 31, H. 5-6. S. 269-274.

Luthi, R. and Meyer, E. and Haefke, H. and Howald, L. and Guntherodt, H. J.. (1995) Friction force microscopy in ultrahigh-vacuum - study on C-60 thin-films deposited on NaCl. Abstracts of papers / American Chemical Society, Vol. 209, H. Part 1 , S. 216-COLL.

Luthi, R. and Meyer, E. and Haefke, H. and Howald, L. and Guntherodt, H. J. and Gyalog, T. and Thomas, H.. (1995) Friction force microscopy in ultrahigh vacuum : an atomic-scale study. Abstracts of papers / American Chemical Society, Vol. 209, H. Part 1 , S. 143-COLL.

1994

Luthi, R. and Haefke, H. and Gutmannsbauer, W. and Meyer, E. and Howald, L. and Guntherodt, H. J.. (1994) Statics and dynamics of ferroelectric domains studied with scanning force microscopy. Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement, and phenomena, Vol. 12, H. 4. S. 2451-2455.

Howald, L. and Luthi, R. and Meyer, E. and Guthner, P. and Guntherodt, H. J.. (1994) Scanning force microscopy on the Si(111)7×7 surface reconstruction. Zeitschrift für Physik. B, Condensed matter, Vol. 93, H. 3. S. 267-268.

Gimzewski, J. K. and Gerber, C. and Meyer, E. and Schlittler, R. R.. (1994) Observation of a chemical reaction using a micromechanical sensor. Chemical Physics Letters, Vol. 217, H. 5-6. S. 589-594.

Howald, L. and Haefke, H. and Luthi, R. and Meyer, E. and Gerth, G. and Rudin, H. and Guntherodt, H. J.. (1994) Ultrahigh-vacuum scanning force microscopy : atomic-scale resolution at monatomic cleavage steps. Physical Review B, Vol. 49, H. 8. S. 5651-5656.

Overney, R. M. and Takano, H. and Fujihira, M. and Meyer, E. and Guntherodt, H. J.. (1994) Wear, friction and sliding speed correlations on Langmuir-Blodgett-films observed by atomic force microscopy. Thin Solid Films, Vol. 240, H. 1-2. S. 105-109.

Scandella, L. and Schumacher, A. and Kruse, N. and Prins, R. and Meyer, E. and Luthi, R. and Howald, L. and Guntherodt, H. J.. (1994) Tribology of ultra-thin MoS2 platelets on mica : studies by scanning force microscopy. Thin Solid Films, Vol. 240, H. 1-2. S. 101-104.

Overney, R. M. and Meyer, E. and Frommer, J. and Guntherodt, H. J. and Fujihira, M. and Takano, H. and Gotoh, Y.. (1994) Force Microscopy Study of Friction and Elastic Compliance of Phase-Separated Organic Thin Films. Langmuir, Vol. 10, H. 4. S. 1281-1286.

Howald, L. and Luthi, R. and Meyer, E. and Gerth, G. and Haefke, H. G. and Overney, R. and Guntherodt, H. J.. (1994) Friction force microscopy on clean surfaces of NaCl, NaF, and AgBr. Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement, and phenomena, Vol. 12, H. 3. S. 2227-2230.

Meyer, E. and Howald, L. and Luthi, R. and Haefke, H. and Ruetschi, M. and Bonner, T. and Overney, R. and Frommer, J. and Hofer, R. and Guntheroidt, H. J.. (1994) Scanning probe microscopy on the surface of Si(111). Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement, and phenomena, Vol. 12, H. 3. S. 2060-2063.

Overney, R. M. and Bonner, T. and Meyer, E. and Reutschi, M. and Luthi, R. and Howald, L. and Frommer, J. and Guntherodt, H. J. and Fujihara, M. and Takano, H.. (1994) Elasticity, wear, and friction properties of thin organic films observed with atomic force microscopy. Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement, and phenomena, Vol. 12, H. 3. S. 1973-1976.

Luthi, R. and Meyer, E. and Howald, L. and Haefke, H. and Anselmetti, D. and Dreier, M. and Ruetsche, M. and Bonner, T. and Overney, R. M. and Frommer, J. and Guntherodt, H. J.. (1994) Progress in noncontract dynamic force microscopy. Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement, and phenomena, Vol. 12, H. 3. S. 1673-1676.

Anselmetti, D. and Dreier, M. and Luthi, R. and Richmond, T. and Meyer, E. and Frommer, J. and Guntherodt, H. J.. (1994) Biological materials studied with dynamic force microscopy. Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement, and phenomena, Vol. 12, H. 3. S. 1500-1503.

Luthi, R. and Haefke, H. and Meyer, E. and Howald, L. and Lang, H. P. and Gerth, G. and Guntherodt, H. J.. (1994) Frictional and atomic-scale study of C60 thin films by scanning force microscopy. Zeitschrift für Physik. B, Condensed matter, Vol. 95, H. 1. S. 1-3.

Anselmetti, D. and Luthi, R. and Meyer, E. and Richmond, T. and Dreier, M. and Frommer, J. E. and Guntherodt, H. J.. (1994) Attractive-mode imaging of biological materials with dynamic force microscopy. Nanotechnology, Vol. 5, H. 2. S. 87-94.

Luthi, R. and Meyer, E. and Haefke, H. and Howald, L. and Gutmannsbauer, W. and Guntherodt, H. J.. (1994) Sled-type motion on the nanometer scale : determination of dissipation and cohesive energies of C-60. Science, Vol. 266, H. 5193. S. 1979-1981.

Luthi, R. and Meyer, E. and Haefke, H. and Howald, L. and Guntherodt, H. J.. (1994) Nanosled experiments - determination of dissipation and cohesive energies of C-60 with UHV-SFM. Helvetica physica acta, Vol. 67, H. 7. S. 755-756.

1993

Dammer, U. and Anselmetti, D. and Dreier, M. and Frommer, J. and Funfschilling, J. and Gerth, G. and Guntherodt, H. J. and Haefke, H. and Hidber, H. R. and Howald, L. and HUG, H. J. and Jung, T. H. and Lang, H. P. and Luthi, R. and Meyer, E. and Moser, A. and Parashikov, I. and Reimann, P. and Richmond, T. and Ruetschi, M. and Rudin, H. and Schwarz, U. D. and Staufer, U. and SUM, R.. (1993) Scanning probe microscopy for industrial applications : selected examples. Scanning, Vol. 15, H. 5. S. 257-264.

Frommer, J. and Luthi, R. and Meyer, E. and Anselmetti, D. and Dreier, M. and Overney, R. and Guntherodt, H. J. and Fujihira, M.. (1993) Adsorption at domain edges. Nature, Vol. 364, H. 6434. S. 198.

Howald, L. and Meyer, E. and Luthi, R. and Haefke, H. and Overney, R. and Rudin, H. and Guntherodt, H. J.. (1993) Multifunctional probe microscope for facile operation in ultrahigh-vacuum. Applied physics letters, Vol. 63, H. 1. S. 117-119.

Overney, R. M. and Meyer, E. and Frommer, J. and Guntherodt, H. J. and Decher, G. and Reibel, J. and Sohling, U.. (1993) A comparative atomic force microscopic study of liquid crystal films: transferred freely-suspended vs. Langmuir-Blodgett : morphology, lattice, and manipulation. Langmuir, Vol. 9, H. 1. S. 341-346.

Bogli, U. and Blatter, A. and Bachli, A. and Luthi, R. and Meyer, E.. (1993) Characterization of laser-irradiated surfaces of a polycrystalline diamond film with an atomic-force microscope. Diamond And Related Materials, Vol. 2, H. 5-7. S. 924-927.

Luthi, R. and Haefke, H. and Meyer, K. P. and Meyer, E. and Howald, L. and Ruetschi, M. and Overney, R. M. and Guntherodt, H. J.. (1993) Investigation on ferroelectric domains and domain-walls with scanning force microscopy. Helvetica physica acta, Vol. 66, H. 4. S. 415-416.

Luthi, R. and Haefke, H. and Meyer, K. P. and Meyer, E. and Howald, L. and Guntherodt, H. J.. (1993) Surface and domain structures of ferroelectric crystals studied with scanning force microscopy. Journal of applied physics, Vol. 74, H. 12. S. 7461-7471.

Overney, R. M. and Luthi, R. and Haefke, H. and Frommer, J. and Meyer, E. and Guntherodt, H. J. and Hild, S. and Fuhrmann, J.. (1993) An atomic force microscopy study of corona-treated polypropylene films. Applied surface science, Vol. 64, H. 3. S. 197-203.

Meyer, E. and Haefke, H. and Guntherod, H. J. and Anderson, O. and Bange, K.. (1993) Surface-topography of polished and oxide-coated BK-7 glasses investigated by atomic force microscopy. Glastechnische Berichte, Vol. 66, H. 2. S. 30-37.

Overney, R. and Meyer, E.. (1993) Tribological investigation using friction force microscopy. MRS bulletin, Vol. 18, H. 5. S. 26-34.

1992

Schwarz, U. D. and Bohonek, J. and Haefke, H. and Jung, T. A. and Meyer, E. and Steiger, R. and Guntherodt, H. J.. (1992) Microstructures and nanostructures on silver-halide surfaces 2 : morphology of photographic AgBr microcrystals. Helvetica physica acta, Vol. 65, H. 6. S. 874-875.

Haefke, H. and Burgler, D. and Gerth, G. and Howald, L. and Meyer, E. and Schwarz, U. D. and Steiger, R. and Tarrach, G. and Wiesendanger, R.. (1992) Microstructures and nanostructures on silver-halide surfaces 1 : preparation and characterization of AgBr samples. Helvetica physica acta, Vol. 65, H. 6. S. 872-873.

Howald, L. and Luthi, R. and Meyer, E. and Haefke, H. and Overney, R. and Gerth, G. and Rudin, H. and Guntherodt, H. J.. (1992) Bidirectional force microscope for surface-analysis in ultrahigh-vacuum. Helvetica physica acta, Vol. 65, H. 6. S. 868-869.

Meyer, E.. (1992) Atomic force microscopy. Progress In Surface Science, Vol. 41, H. 1. S. 3-49.

Schwarz, U. D. and Haefke, H. and Jung, T. and Meyer, E. and Guntherodt, H. J. and Steiger, R. and Bohonek, J.. (1992) Atomic force microscopy study of tabular AgBr microcrystals (T-grains). Journal Of Imaging Science And Technology, Vol. 36, H. 4. S. 361-365.

Overney, R. M. and Meyer, E. and Frommer, J. and Brodbeck, D. and Luthi, R. and Howald, L. and Guntherodt, H. J. and Fujihira, M. and Takano, H. and Gotoh, Y.. (1992) Friction measurements on phase-separated thin films with a modified atomic force microscope. Nature, Vol. 359, H. 6391. S. 133-135.

Meyer, E. and Overney, R. and Luthi, R. and Brodbeck, D. and Howald, L. and Frommer, J. and Guntherodt, H. J. and Wolter, O. and Fujihira, M. and Takano, H. and Gotoh, Y.. (1992) Friction forc emicroscopy of mixed Langmuir-Blodgett films. Thin Solid Films, Vol. 220, H. 1-2. S. 132-137.

Schwarz, U. D. and Haefke, H. and Jung, T. and Meyer, E. and Guntherodt, H. J. and Steiger, R. and Bohonek, J.. (1992) Plate-like microcrystals of silver bromide investigated by scanning force microscopy. Ultramicroscopy, Vol. 41, H. 4. S. 435-439.

Overney, R. M. and Haefke, H. and Meyer, E. and Guntherodt, H. J.. (1992) Cleavage faces of alkaline-earth fluorides studied by atomic force microscopy. Surface science, Vol. 277, H. 1-2 , L29-L33.

Meyer, E. and Overney, R. and Brodbeck, D. and Howald, L. and Luthi, R. and Frommer, J. and Guntherodt, H. J.. (1992) Friction and wear of Langmuir-Blodgett films observed by friction force microscopy. Physical review letters, Vol. 69, H. 12. S. 1777-1780.

Luthi, R. and Overney, R. M. and Meyer, E. and Howald, L. and Brodbeck, D. and Guntherodt, H. J.. (1992) Measurements on Langmuir-Blodgett-films by friction force microscopy. Helvetica physica acta, Vol. 65, H. 6. S. 866-867.

Meyer, E. and Howald, L. and Overney, R. and Brodbeck, D. and Luthi, R. and Haefke, H. and Frommer, J. and Guntherodt, H. J.. (1992) Structure and dynamics of solid surfaces observed by atomic force microscopy. Ultramicroscopy, Vol. 42, Part A. S. 274-280.

Haefke, H. and Meyer, E. and Howald, L. and Schwarz, U. and Gerth, G. and Krohn, M.. (1992) Atomic surface and lattice structures of AgBr thin-films. Ultramicroscopy, Vol. 42, Part A. S. 290-297.

Overney, R. M. and Howald, L. and Frommer, J. and Meyer, E. and Brodbeck, D. and Guntherodt, H. J.. (1992) Molecular surface structure of organic crystals observed by atomic force microscopy. Ultramicroscopy, Vol. 42, Part B. S. 983-988.

Schabert, F. and Hefti, A. and Goldie, K. and Stemmer, A. and Engel, A. and Meyer, E. and Overney, R. and Guntherodt, H. J.. (1992) Ambient-pressure scanning probe microscopy of 2D regular protein arrays. Ultramicroscopy, Vol. 42, Part B. S. 1118-1124.

Brodbeck, D. and Howald, L. and Luthi, R. and Meyer, E. and Overney, R.. (1992) Scan control and data acquisition for bidirectional force microscopy. Ultramicroscopy, Vol. 42, Part B. S. 1580-1584.

1991

Overney, R. M. and Howald, L. and Frommer, J. and Meyer, E. and Guntherodt, H. J.. (1991) Molecular surface structure of tetracene mapped by the atomic force microscope. Journal of Chemical Physics, 94 (12). pp. 8441-8443.

Meyer, E. and Howald, L. and Overney, R. M. and Heinzelmann, H. and Frommer, J. and Guntherodt, H. J. and Wagner, T. and Schier, H. and Roth, S.. (1991) Molecular-resolution images of Langmuir-Blodgett films using atomic force microscopy. Nature, Vol. 349, H. 6308. S. 398-400.

Haefke, H. and Meyer, E. and Guntherodt, H. J. and Gerth, G. and Krohn, M.. (1991) Atomic structures of AGBR(001) surfaces. Journal Of Imaging Science, Vol. 35, H. 5. S. 290-292.

Meyer, E. and Heinzelmann, H. and Brodbeck, D. and Overney, G. and Overney, R. and Howald, L. and HUG, H. and Jung, T. and Hidber, H. R. and Guntherodt, H. J.. (1991) Atomic resolution on the surface of LiF(100) by atomic force microscopy. Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement, and phenomena, Vol. 9, H. 2, Part 2. S. 1329-1332.

Frommer, J. and Meyer, E.. (1991) Atomic force microscopy : a tool for surface science. Journal of physics. Condensed matter, Vol. 3, Suppl. A , S1-S9.

Meyer, E. and Frommer, J.. (1991) Forcing surface issues. Physics World, Vol. 4, H. 4. S. 46-49.

1990

Meyer, E. and Heinzelmann, H. and Rudin, H. and Guntherodt, H. J.. (1990) Atomic resolution on LiF (001) by atomic force microscopy. Zeitschrift für Physik. B, Condensed matter, Vol. 79, H. 1. S. 3-4.

Meyer, E. and Wiesendanger, R. and Anselmetti, D. and Hidber, H. R. and Guntherodt, H. J. and Levy, F. and Berger, H.. (1990) Different Response of Atomic Force Microscopy and Scanning Tunnelling Microscopy to Charge Density Waves. Journal of vacuum science & technology. A, Vacuum, surfaces and films, Vol. 8, H. 1. S. 495-499.

Meyer, E. and Heinzelmann, H. and Brodbeck, D. and Overney, G. and Howald, L. and Guntherodt, H. J.. (1990) Atomic force microscopy : high-resolution and contrast mechanism. Helvetica physica acta, Vol. 63, H. 6. S. 793-794.

1989

Heinzelmann, H. and Meyer, E. and Guntherodt, H. J. and Steiger, R.. (1989) Local step structure of the AgBr(100) and (111) surfaces studied by atomic force microscopy. Surface science, Vol. 221, H. 1-2. S. 1-10.

1988

Grutter, P. and Meyer, E. and Heinzelmann, H. and Rosenthaler, L. and Hidber, H. R. and Guntherodt, H. J.. (1988) Application of atomic force microscopy to magnetic materials. Journal of vacuum science & technology. A, Vacuum, surfaces and films, Vol. 6, H. 2. S. 279-282.

Heinzelmann, H. and Meyer, E. and Grutter, P. and Hidber, H. R. and Rosenthaler, L. and Guntherodt, H. J.. (1988) Atomic force microscopy : general aspects and application to insulators. Journal of vacuum science & technology. A, Vacuum, surfaces and films, Vol. 6, H. 2. S. 275-278.

1987

Heinzelmann, H. and Grutter, P. and Meyer, E. and Hidber, H. and Rosenthaler, L. and Ringger, M. and Guntherodt, H. J.. (1987) Design of an atomic force microscope and first results. Surface science, Vol. 189. S. 29-35.

J. J. Saenz, N. Garcia and P. GrUtter, E. Meyer and H. Heinzelmann, R. Wiesendanger and L. Rosenthaler, H. R. Hidber. (1987) Observation of magnetic forces by the atomic force microscope. Journal of applied physics, Vol. 62, H. 10. S. 4293-4295.