The noise of cantilevers

Rast, S. and Wattinger, C. and Gysin, U. and Meyer, E.. (2000) The noise of cantilevers. Nanotechnology, Vol. 11, H. 3. pp. 169-172.

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Official URL: http://edoc.unibas.ch/dok/A5262154

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Micromechanical cantilevers used in atomic force microscopy are characterized by the geometry, the elastic modulus E and the quality factor Q. The sensor can be regarded as a rectangular bar clamped on one side and free on the other. In contrast to a simple harmonic oscillator a cantilever has different eigenfrequencies omega(n) and a mode-dependent spring constant D-n. Using the fluctuation-dissipation theorem we developed a simple model to calculate the thermal noise on each eigenmode for a free cantilever. With this result we can decide whether measuring on higher eigenmodes increases the force sensitivity.
Faculties and Departments:05 Faculty of Science > Departement Physik > Physik > Nanomechanik (Meyer)
UniBasel Contributors:Meyer, Ernst
Item Type:Article, refereed
Article Subtype:Research Article
Publisher:IOP Publ.
Note:Publication type according to Uni Basel Research Database: Journal article
Identification Number:
Last Modified:22 Mar 2012 14:27
Deposited On:22 Mar 2012 13:58

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