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Phase variation experiments in non-contact dynamic force microscopy using phase locked loop techniques

Loppacher, C. and Bammerlin, M. and Guggisberg, M. and Battiston, F. and Bennewitz, R. and Rast, S. and Baratoff, A. and Meyer, E. and Guntherodt, H. J.. (1999) Phase variation experiments in non-contact dynamic force microscopy using phase locked loop techniques. Applied surface science, Vol. 140, H. 3-4. pp. 287-292.

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Official URL: http://edoc.unibas.ch/dok/A5839451

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Abstract

This work presents constant amplitude Dynamic Force microscopy (DFM) measurements under ultra-high vacuum conditions performed with home-built digital electronics based on the principle of phase locked loop (PLL) techniques. In DFM so-called topography is often measured in constant frequency shift (Delta f) mode. This study describes the influence of phase shifts on constant af imaging. Therefore, phase variation experiments were acquired, leading to information about the cantilever resonance behaviour close to the surface. As sample, an evaporated thin film of NaCl on a Cu(111) substrate was chosen in order to obtain a heterogeneous system with clean Cu and NaCl areas. The atomic structure of both materials was resolved, which is the first time true atomic resolution was obtained on a metal. Large apparent topography variations are observed on this heterogeneous sample when changing the phase between the excitation and oscillation of the cantilever end. Such artefacts can be explained by comparison with phase variation experiments. (C) 1999 Elsevier Science B.V. All rights reserved.
Faculties and Departments:05 Faculty of Science > Departement Physik > Physik > Nanomechanik (Meyer)
UniBasel Contributors:Meyer, Ernst
Item Type:Article, refereed
Article Subtype:Research Article
Bibsysno:Link to catalogue
Publisher:North-Holland
ISSN:0169-4332
Note:Publication type according to Uni Basel Research Database: Journal article
Identification Number:
Last Modified:14 Sep 2012 07:18
Deposited On:14 Sep 2012 06:44

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