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Bidirectional force microscope for surface-analysis in ultrahigh-vacuum

Howald, L. and Luthi, R. and Meyer, E. and Haefke, H. and Overney, R. and Gerth, G. and Rudin, H. and Guntherodt, H. J.. (1992) Bidirectional force microscope for surface-analysis in ultrahigh-vacuum. Helvetica physica acta, Vol. 65, H. 6. pp. 868-869.

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Official URL: http://edoc.unibas.ch/dok/A5839513

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Abstract

A scanning force microscope for remote controlled operation in ultra high vacuum is described. The normal and lateral forces, acting on the sensor, can be measured simultaneously with the tunneling current between sensor tip and sample. The optical beam deflection detector and the sample position. can be adjusted by means of three compact inertial stepping motors.
Faculties and Departments:05 Faculty of Science > Departement Physik > Physik > Nanomechanik (Meyer)
UniBasel Contributors:Meyer, Ernst
Item Type:Article, refereed
Article Subtype:Research Article
Bibsysno:Link to catalogue
Publisher:Birkhäuser
ISSN:0018-0238
Note:Publication type according to Uni Basel Research Database: Journal article
Identification Number:
Last Modified:14 Sep 2012 07:17
Deposited On:14 Sep 2012 06:42

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