edoc

Design and performance of a combined secondary ion mass spectrometry-scanning probe microscopy instrument for high sensitivity and high-resolution elemental three-dimensional analysis

Wirtz, Tom and Fleming, Yves and Gerard, Mathieu and Gysin, Urs and Glatzel, Thilo and Meyer, Ernst and Wegmann, Urs and Maier, Urs and Odriozola, Aitziber Herrero and Uehli, Daniel. (2012) Design and performance of a combined secondary ion mass spectrometry-scanning probe microscopy instrument for high sensitivity and high-resolution elemental three-dimensional analysis. Review of scientific instruments, Vol. 83, H. 6 , 063702.

Full text not available from this repository.

Official URL: http://edoc.unibas.ch/dok/A6083416

Downloads: Statistics Overview


Faculties and Departments:05 Faculty of Science > Departement Physik > Physik > Nanomechanik (Meyer)
UniBasel Contributors:Meyer, Ernst
Item Type:Article, refereed
Article Subtype:Research Article
Bibsysno:Link to catalogue
Publisher:American Institute of Physics
ISSN:0034-6748
Note:Publication type according to Uni Basel Research Database: Journal article
Identification Number:
Last Modified:24 May 2013 09:22
Deposited On:24 May 2013 09:03

Repository Staff Only: item control page