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Atomic-force microscopy on the Si(111) 7x7 surface

Howald, L. and Luthi, R. and Meyer, E. and Guntherodt, H. J.. (1995) Atomic-force microscopy on the Si(111) 7x7 surface. Physical Review B, Vol. 51, H. 8. pp. 5484-5487.

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Official URL: http://edoc.unibas.ch/dok/A5839483

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Faculties and Departments:05 Faculty of Science > Departement Physik > Physik > Nanomechanik (Meyer)
UniBasel Contributors:Meyer, Ernst
Item Type:Article, refereed
Article Subtype:Research Article
Bibsysno:Link to catalogue
Publisher:American Institute of Physics
ISSN:0163-1829
Note:Publication type according to Uni Basel Research Database: Journal article
Identification Number:
Last Modified:14 Sep 2012 07:18
Deposited On:14 Sep 2012 06:43

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