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Fuzzy controlled feedback applied to a combined scanning tunneling and force microscope

Battiston, F. M. and Bammerlin, M. and Loppacher, C. and Luthi, R. and Meyer, E. and Guntherodt, H. J. and Eggimann, F.. (1998) Fuzzy controlled feedback applied to a combined scanning tunneling and force microscope. Applied physics letters, Vol. 72, H. 1. pp. 25-27.

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Official URL: http://edoc.unibas.ch/dok/A5839464

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Abstract

A feedback mechanism based on fuzzy logic has been applied to operate a combined atomic force microscope (AFM)/scanning tunneling microscope (STM), which is able to measure the resonance frequency shift Delta f of the cantilever-type spring and the mean tunneling current >(I)over bar (t)< simultaneously. Using a decision making logic, the microscope can be scanned over a heterogeneous surface without tip crash. On the conductive parts of the sample, the STM mode is preferred, whereas the noncontact (nc)-AFM mode is used on the poorly conductive parts of the surface. The transition from the STM mode to nc-AFM mode is performed smoothly with the fuzzy logic feedback. (C) 1998 American Institute of Physics.
Faculties and Departments:05 Faculty of Science > Departement Physik > Physik > Nanomechanik (Meyer)
UniBasel Contributors:Meyer, Ernst
Item Type:Article, refereed
Article Subtype:Research Article
Bibsysno:Link to catalogue
Publisher:American Institute of Physics
ISSN:0003-6951
Note:Publication type according to Uni Basel Research Database: Journal article
Identification Number:
Last Modified:14 Sep 2012 07:18
Deposited On:14 Sep 2012 06:43

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