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Multiscale approach for simulations of Kelvin probe force microscopy with atomic resolution

Sadeghi, Ali and Baratoff, Alexis and Ghasemi, S. Alireza and Goedecker, Stefan and Glatzel, Thilo and Kawai, Shigeki and Meyer, Ernst. (2012) Multiscale approach for simulations of Kelvin probe force microscopy with atomic resolution. Physical Review B, Vol. 86, H. 7 , 075407.

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Official URL: http://edoc.unibas.ch/dok/A6083414

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Faculties and Departments:05 Faculty of Science > Departement Physik > Physik > Nanomechanik (Meyer)
UniBasel Contributors:Meyer, Ernst
Item Type:Article, refereed
Article Subtype:Research Article
Bibsysno:Link to catalogue
Publisher:American Institute of Physics
ISSN:0163-1829
Note:Publication type according to Uni Basel Research Database: Journal article
Identification Number:
Last Modified:24 May 2013 09:22
Deposited On:24 May 2013 09:02

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