Progress in noncontract dynamic force microscopy

Luthi, R. and Meyer, E. and Howald, L. and Haefke, H. and Anselmetti, D. and Dreier, M. and Ruetsche, M. and Bonner, T. and Overney, R. M. and Frommer, J. and Guntherodt, H. J.. (1994) Progress in noncontract dynamic force microscopy. Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement, and phenomena, Vol. 12, H. 3. pp. 1673-1676.

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Official URL: http://edoc.unibas.ch/dok/A5839490

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The technique of operating the scanning force microscope in the dynamic noncontact mode (dynamic force microscopy) has been improved. Home-built instruments based on an optical beam deflection scheme in two different environments were used. The two force microscopes were operated in ambient air and in ultrahigh vacuum, respectively. In order to control the oscillating cantilever different methods were applied: slope-detection (lock-in amplifier, RMS-to-DC converter) and frequency modulation (FM) technique as well. The advantages of this nondestructive technique are demonstrated on different samples, such as soft organic matter (hexagonally packed intermediate layer, Langmuir-Blodgett film), layer-structured compounds (CdI2), n-doped Si(111), and ferroelectric crystals [triglycine sulfate (TGS), guanidinium aluminum sulfate hexahydrate (GASH)]. On TGS and GASH cleavage faces, the ferroelectric domains and domain walls could be imaged. From experimental data a spatial resolution of about 1-2 nm in lateral and >0.1 nm in vertical directions could be determined.
Faculties and Departments:05 Faculty of Science > Departement Physik > Physik > Nanomechanik (Meyer)
UniBasel Contributors:Meyer, Ernst
Item Type:Article, refereed
Article Subtype:Research Article
Publisher:American Vacuum Society
Note:Publication type according to Uni Basel Research Database: Journal article
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Last Modified:14 Sep 2012 07:18
Deposited On:14 Sep 2012 06:43

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