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Experimental aspects of dissipation force microscopy

Loppacher, C. and Bennewitz, R. and Pfeiffer, O. and Guggisberg, M. and Bammerlin, M. and Schar, S. and Barwich, V. and Baratoff, A. and Meyer, E.. (2000) Experimental aspects of dissipation force microscopy. Physical Review B, Vol. 62, H. 20. pp. 13674-13679.

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Official URL: http://edoc.unibas.ch/dok/A5262153

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Abstract

Experimental aspects of measuring dissipation on atomic scale using large-amplitude dynamic force microscopy are discussed. Dissipation versus distance curves reveal that long- and short-range forces contribute to the dissipation. The decay length of short-range contributions is found to be close to that of the tunneling current. The dependence of dissipation on the bias voltage and on the oscillation amplitude is presented. Atomic-scale lateral variations of dissipation are discussed; and the role of the atomic constitution of the tip for quantitative results is pointed out.
Faculties and Departments:05 Faculty of Science > Departement Physik > Physik > Nanomechanik (Meyer)
UniBasel Contributors:Meyer, Ernst
Item Type:Article, refereed
Article Subtype:Research Article
Bibsysno:Link to catalogue
Publisher:American Institute of Physics
ISSN:0163-1829
Note:Publication type according to Uni Basel Research Database: Journal article
Identification Number:
Last Modified:22 Mar 2012 14:25
Deposited On:22 Mar 2012 13:48

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