Separation of interactions by noncontact force microscopy

Guggisberg, M. and Bammerlin, M. and Loppacher, C. and Pfeiffer, O. and Abdurixit, A. and Barwich, V. and Bennewitz, R. and Baratoff, A. and Meyer, E. and Guntherodt, H. J.. (2000) Separation of interactions by noncontact force microscopy. Physical Review B, Vol. 61, H. 16. pp. 11151-11155.

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Official URL: http://edoc.unibas.ch/dok/A5262159

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Quantitative measurements of frequency shift vs distance curves of ultrahigh-vacuum force microscopy in a noncontact mode are presented. Different contributions from electrostatic, van der Waals, and chemical interactions are determined by a systematic procedure. First, long-range electrostatic interactions are eliminated by compensating for the contact potential difference between the probing tip and the sample. Second, the long-range van der Waals contribution is determined by fitting the data for distances between 1 and 6 nm. Third, the van der Waals part is subtracted from the interaction curves. The remaining part corresponds to the shea-range chemical interaction, and is found to decrease exponentially. A Morse potential is used to fit these data. The determined parameters indicate that the interaction potential between single atoms can be measured by force microscopy in a noncontact mode.
Faculties and Departments:05 Faculty of Science > Departement Physik > Physik > Nanomechanik (Meyer)
UniBasel Contributors:Meyer, Ernst
Item Type:Article, refereed
Article Subtype:Research Article
Publisher:American Institute of Physics
Note:Publication type according to Uni Basel Research Database: Journal article
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Last Modified:22 Mar 2012 14:25
Deposited On:22 Mar 2012 13:48

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