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Combined SIMS-SPM instrument for high sensitivity and high-resolution elemental 3D analysis

Wirtz, Tom and Fleming, Yves and Gysin, Urs and Glatzel, Thilo and Wegmann, Urs and Meyer, Ernst and Maier, Urs and Rychen, Joerg. (2013) Combined SIMS-SPM instrument for high sensitivity and high-resolution elemental 3D analysis. Surface and interface analysis, Vol. 45, H. 1,. pp. 513-516.

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Official URL: http://edoc.unibas.ch/dok/A6223382

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Faculties and Departments:05 Faculty of Science > Departement Physik > Physik > Nanomechanik (Meyer)
UniBasel Contributors:Meyer, Ernst
Item Type:Article, refereed
Article Subtype:Research Article
Bibsysno:Link to catalogue
Publisher:Wiley
ISSN:0142-2421
Note:Publication type according to Uni Basel Research Database: Journal article
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Last Modified:27 Mar 2014 13:12
Deposited On:27 Mar 2014 13:12

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