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Surface potential studies of self-assembling monolayers using Kelvin probe force microscopy

Lu, J. and Eng, L. and Bennewitz, R. and Meyer, E. and Guntherodt, H. J. and Delamarche, E. and Scandella, L.. (1999) Surface potential studies of self-assembling monolayers using Kelvin probe force microscopy. Surface and interface analysis, Vol. 27, H. 5-6. pp. 368-373.

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Official URL: http://edoc.unibas.ch/dok/A5839449

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Abstract

The local contact potential difference (CPD) of different self-assembled n-alkanethiol monolayers on Au substrates has been measured using Kelvin probe force microscopy (KPFM). Our results demonstrate that KPFM can be used to obtain topography and CPD information simultaneously. The measured CPDs show a clear chemical contrast, allowing us to distinguish between thiol molecules with different terminal groups, The CPD values of the same terminal group are found to vary with chain length, which is explained in the context of the dipole layer model. Copyright (C) 1999 John Whey & Sons, Ltd.
Faculties and Departments:05 Faculty of Science > Departement Physik > Physik > Nanomechanik (Meyer)
UniBasel Contributors:Meyer, Ernst
Item Type:Article, refereed
Article Subtype:Research Article
Bibsysno:Link to catalogue
Publisher:Wiley
ISSN:0142-2421
Note:Publication type according to Uni Basel Research Database: Journal article
Identification Number:
Last Modified:14 Sep 2012 07:18
Deposited On:14 Sep 2012 06:44

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