Frommer, J. and Meyer, E.. (1991) Atomic force microscopy : a tool for surface science. Journal of physics. Condensed matter, Vol. 3, Suppl. A , S1-S9.
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Official URL: http://edoc.unibas.ch/dok/A5839526
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Abstract
The understanding and manipulation of surfaces have been greatly helped by a variety of atomic force microscopes.
| Faculties and Departments: | 05 Faculty of Science > Departement Physik > Physik > Nanomechanik (Meyer) |
|---|---|
| UniBasel Contributors: | Meyer, Ernst |
| Item Type: | Article, refereed |
| Article Subtype: | Research Article |
| Publisher: | Institute of Physics Publishing |
| ISSN: | 0953-8984 |
| Note: | Publication type according to Uni Basel Research Database: Journal article |
| Identification Number: |
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| Last Modified: | 14 Sep 2012 07:18 |
| Deposited On: | 14 Sep 2012 06:45 |
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