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Work function of few layer graphene covered nickel thin films measured with Kelvin probe force microscopy

Eren, B. and Gysin, U. and Marot, L. and Glatzel, Th and Steiner, R. and Meyer, E.. (2016) Work function of few layer graphene covered nickel thin films measured with Kelvin probe force microscopy. Applied Physics Letters, 108 (4). 041602.

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Abstract

Few layer graphene and graphite are simultaneously grown on a similar to 100 nm thick polycrystalline nickel film. The work function of few layer graphene/Ni is found to be 4.15 eV with a variation of 50 meV by local measurements with Kelvin probe force microscopy. This value is lower than the work function of free standing graphene due to peculiar electronic structure resulting from metal 3d-carbon 2p(pi) hybridization. (C) 2016 AIP Publishing LLC.
Faculties and Departments:05 Faculty of Science > Departement Physik > Physik > Nanomechanik (Meyer)
UniBasel Contributors:Meyer, Ernst and Marot, Laurent and Glatzel, Thilo
Item Type:Article, refereed
Article Subtype:Research Article
Publisher:AIP Publishing
ISSN:0003-6951
e-ISSN:1077-3118
Note:Publication type according to Uni Basel Research Database: Journal article
Language:English
Identification Number:
Last Modified:05 Apr 2018 07:18
Deposited On:15 Feb 2017 10:29

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