Scanning probe Microscopy in materials science

Lucas, Marcel and Riedo, Elisa. (2004) Scanning probe Microscopy in materials science. MRS bulletin : a publication of the Materials Research Society, Vol. 29, no. 7. pp. 443-448.

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Official URL: http://edoc.unibas.ch/dok/A5262121

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This brief article introduces the July 2004 issue of MRS Bulletin, focusing on Scanning Probe Microscopy in Materials Science. Those application areas of scanning probe microscopy (SPM) in which the most impact has been made in recent years are covered in the articles in this theme. They include polymers and semiconductors, where scanning force microscopy is now virtually a standard characterization method; magnetism, where magnetic force microscopy has served both as a routine analytical approach and a method for fundamental studies; tribology, where friction force microscopy has opened entirely new vistas of investigation; biological materials, where atomic force microscopy in an aqueous environment allows biosystems to be imaged and measured in a native (or near-native) state; and nanostructured materials, where SPM has often been the only approach capable of elucidating nanostructures.
Faculties and Departments:05 Faculty of Science > Departement Physik > Physik > Nanomechanik (Meyer)
UniBasel Contributors:Meyer, Ernst
Item Type:Article
Article Subtype:Research Article
Note:Publication type according to Uni Basel Research Database: Journal article
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Last Modified:04 Sep 2015 14:31
Deposited On:22 Mar 2012 13:51

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