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Nanoscale fracture studies using the scanning force microscope

Baumeister, B. and Jung, T. A. and Meyer, E.. (2001) Nanoscale fracture studies using the scanning force microscope. Applied physics letters, Vol. 78, H. 17. pp. 2485-2487.

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Official URL: http://edoc.unibas.ch/dok/A5262149

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Abstract

We present a variety of experiments concerning friction and fracture mechanisms using two-dimensional arrays of microfabricated nanotowers as templates. The scanning force microscope tip is used as a tool to apply well-defined forces to the surface of the patterned substrate. Force statistic measurements reveal information about the forces involved in the fracture process and the probability of fracture of selected towers. These methods are discussed in the context of nanometer-scale mechanisms. Using optimized parameters, a controlled removal of individual nanotowers and the ability to "write" predefined patterns on a nanometer scale can be achieved.
Faculties and Departments:05 Faculty of Science > Departement Physik > Physik > Nanomechanik (Meyer)
UniBasel Contributors:Meyer, Ernst
Item Type:Article, refereed
Article Subtype:Research Article
Bibsysno:Link to catalogue
Publisher:American Institute of Physics
ISSN:0003-6951
Note:Publication type according to Uni Basel Research Database: Journal article
Identification Number:
Last Modified:22 Mar 2012 14:26
Deposited On:22 Mar 2012 13:54

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