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Atomic resolution on the surface of LiF(100) by atomic force microscopy

Meyer, E. and Heinzelmann, H. and Brodbeck, D. and Overney, G. and Overney, R. and Howald, L. and HUG, H. and Jung, T. and Hidber, H. R. and Guntherodt, H. J.. (1991) Atomic resolution on the surface of LiF(100) by atomic force microscopy. Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement, and phenomena, Vol. 9, H. 2, Part 2. pp. 1329-1332.

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Official URL: http://edoc.unibas.ch/dok/A5839529

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Abstract

Atomic force microscopy (AFM) has already demonstrated its usefulness on a nanometer scale surpassing the resolution of conventional profilometers and probing different interactions such as repulsive contact, electrostatic, and magnetic forces. On an atomic scale the fundamental contrast mechanisms are still under investigation. The atomic resolution on layered materials such as graphite, boron nitride, transition metal dichalcogenides, and MnPS3 shows the great potential of this technique. Several experimental and theoretical investigations on these lavered materials have shown that the presence of the AFM tip can lead to a significant distortion of the electronic and atomic structure. For small loadings (less-than-or-equal-to 10(-8) N) the tip causes long-range elastic deformations while for higher loadings a sharp tip can puncture the sample. To explain the atomic scale features being measured with higher loadings, different mechanisms such as the dragging of flakes or shearing of layers have been suggested. The application of AFM to nonlayered structures gives the opportunity to exclude several of these influences. Here we present atomically resolved images of LiF(100). The measurements are compared to results from different surface sensitive techniques such as helium scattering and low energy electron diffraction (LEED). The contrast mechanisms of AFM are discussed in relation to these experiments.
Faculties and Departments:05 Faculty of Science > Departement Physik > Physik > Nanomechanik (Meyer)
UniBasel Contributors:Meyer, Ernst
Item Type:Article, refereed
Article Subtype:Research Article
Bibsysno:Link to catalogue
Publisher:American Vacuum Society
ISSN:1071-1023
Note:Publication type according to Uni Basel Research Database: Journal article
Identification Number:
Last Modified:14 Sep 2012 07:17
Deposited On:14 Sep 2012 06:42

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