Ubiquitous mechanisms of energy dissipation in noncontact atomic force microscopy

Ghasemi, S. Alireza and Goedecker, Stefan and Baratoff, Alexis and Lenosky, Thomas and Meyer, Ernst and Hug, Hans J.. (2008) Ubiquitous mechanisms of energy dissipation in noncontact atomic force microscopy. Physical review letters, Vol. 100, H. 23 , 236106, 4 S..

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Official URL: http://edoc.unibas.ch/dok/A5262101

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Atomistic simulations considering larger tip structures than hitherto assumed reveal novel dissipation mechanisms in noncontact atomic force microscopy. The potential energy surfaces of realistic silicon tips exhibit many energetically close local minima that correspond to different structures. Most of them easily deform, thus causing dissipation arising from hysteresis in force versus distance characteristics. Furthermore, saddle points which connect local minima can suddenly switch to connect different minima. Configurations driven into metastability by the tip motion can thus suddenly access lower energy structures when thermal activation becomes allowed within the time required to detect the resulting average dissipation.
Faculties and Departments:05 Faculty of Science > Departement Physik > Physik > Nanomechanik (Meyer)
UniBasel Contributors:Meyer, Ernst and Goedecker, Stefan and Hug, Hans Josef and Ghasemi, Seyed Alireza
Item Type:Article, refereed
Article Subtype:Research Article
Publisher:American Physical Society
Note:Publication type according to Uni Basel Research Database: Journal article
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Last Modified:22 Mar 2012 14:26
Deposited On:22 Mar 2012 13:53

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