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Dissipation mechanisms studied by dynamic force microscopies

Meyer, E. and Bennewitz, R. and Pfeiffer, O. and Barwich, V. and Guggisberg, M. and Schar, S. and Bammerlin, M. and Loppacher, C. and Gysin, U. and Wattinger, C. and Baratoff, A.. (2001) Dissipation mechanisms studied by dynamic force microscopies. In: Fundamentals of tribology and bridging the gap between the macro- and micro-nanoscales (NATO science series II, Mathematics, physics and chemistry, Vol. 10). Dordrecht, pp. 67-81.

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Official URL: http://edoc.unibas.ch/dok/A5262144

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Abstract

Tile dissipation mechanisms of contact force microscopy on solid surfaces are related to the fast motion during the slip process. Different degrees of freedom can be excited, such as phonons or electronic excitations. The dissipation mechanisms of dynamic force microscopy (DFM) were recently investigated due to the improvement in large amplitude DFM, also called dissipation force microscopy. Experimental methods to determine damping with DFM will be discussed. When an electrical field is applied between probing tip and sample, damping is observed, which depends on voltage. This type of damping is related to mirror charges, which move in tile sample and/or tip because of the motion of the cantilever. When the contact potential is compensated, this long-range part is minimized. Under these conditions, only short-range damping can be measured, which appears at distances of about 1nm and increases exponentially with closer separation. Recent models of this type of damping show, that there might be a relationship to the local phonon density.
Faculties and Departments:05 Faculty of Science > Departement Physik > Physik > Nanomechanik (Meyer)
UniBasel Contributors:Meyer, Ernst
Item Type:Conference or Workshop Item
Conference or workshop item Subtype:Conference Paper
Bibsysno:Link to catalogue
Publisher:Kluwer Academic Publ.: 2001
Note:Publication type according to Uni Basel Research Database: Conference paper
Identification Number:
Last Modified:22 Mar 2012 14:26
Deposited On:22 Mar 2012 13:55

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