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Combined scanning tunneling and force microscope with fuzzy controlled feedback

Battiston, F. M. and Bammerlin, M. and Loppacher, C. and Guggisberg, M. and Luthi, R. and Meyer, E. and Eggimann, F. and Guntherodt, H. J.. (1998) Combined scanning tunneling and force microscope with fuzzy controlled feedback. Applied physics. A, Materials science & processing, Vol. 66, Part 1 Suppl. S , S49-S53.

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Official URL: http://edoc.unibas.ch/dok/A5839453

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Abstract

Decision-making logic based on fuzzy logic and an adaptive PI-controller was inserted into the feedback loop of a combined atomic force microscope/scanning tunneling microscope (AFM/STM), which is able to measure the frequency shift Delta f of the cantilever-type spring and the mean tunneling current (I) over bar(t) simultanously. Depending on the conductivity of the surface the fuzzy logic controller decides whether it has to use the AFM feedback or the STM feedback. On conductive regions of the sample STM mode is used, whereas on poorly conducting regions the non-contact AFM mode is preferred. This allows one to scan over heterogenous surfaces avoiding a tip crash.
Faculties and Departments:05 Faculty of Science > Departement Physik > Physik > Nanomechanik (Meyer)
UniBasel Contributors:Meyer, Ernst
Item Type:Article, refereed
Article Subtype:Research Article
Bibsysno:Link to catalogue
Publisher:Springer-Verlag
ISSN:1432-0630
Note:Publication type according to Uni Basel Research Database: Journal article
Identification Number:
Last Modified:14 Sep 2012 07:18
Deposited On:14 Sep 2012 06:45

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