Measurements on Langmuir-Blodgett-films by friction force microscopy

Luthi, R. and Overney, R. M. and Meyer, E. and Howald, L. and Brodbeck, D. and Guntherodt, H. J.. (1992) Measurements on Langmuir-Blodgett-films by friction force microscopy. Helvetica physica acta, Vol. 65, H. 6. pp. 866-867.

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Official URL: http://edoc.unibas.ch/dok/A5839512

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A bidirectional force microscope (friction force microscope FFM) of a beam deflection type was built up for experiments at ambient conditions. Normal and lateral forces are measured simultaneously by detecting the deflection of a reflected laser beam with a four-quadrant photodiode. The relation of the topography measured with normal force perpendicular to the surface and the lateral force is discussed. We present FFM measurements on multilayers of Langmuir-Blodgett (LB) films. The friction is largest on the uncovered substrate and is reduced by the LB films acting as lubricant.
Faculties and Departments:05 Faculty of Science > Departement Physik > Physik > Nanomechanik (Meyer)
UniBasel Contributors:Meyer, Ernst
Item Type:Article, refereed
Article Subtype:Research Article
Note:Publication type according to Uni Basel Research Database: Journal article
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Last Modified:14 Sep 2012 07:18
Deposited On:14 Sep 2012 06:43

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