Atomic force microscopy study of tabular AgBr microcrystals (T-grains)

Schwarz, U. D. and Haefke, H. and Jung, T. and Meyer, E. and Guntherodt, H. J. and Steiger, R. and Bohonek, J.. (1992) Atomic force microscopy study of tabular AgBr microcrystals (T-grains). Journal Of Imaging Science And Technology, Vol. 36, H. 4. pp. 361-365.

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Official URL: http://edoc.unibas.ch/dok/A5839524

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The new method of atomic force microscopy has been applied to tabular AgBr microcrystals (T-grains). AgBr T-grain ensembles of different densities are imaged with high contrast and high lateral resolution. The grain surfaces appear to be very flat over large areas. On the top surfaces of single T-grains, well-developed growth hills are revealed. Heights and diameters of individual T-grains and growth hills are determined. The capabilities of atomic force microscopy are discussed in relation to the carbon replica method and scanning electron microscopy.
Faculties and Departments:05 Faculty of Science > Departement Physik > Physik > Nanomechanik (Meyer)
UniBasel Contributors:Meyer, Ernst
Item Type:Article, refereed
Article Subtype:Research Article
Publisher:Society for Imaging Science and Technology
Note:Publication type according to Uni Basel Research Database: Journal article
Identification Number:
Last Modified:14 Sep 2012 07:17
Deposited On:14 Sep 2012 06:42

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