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Molecular surface structure of tetracene mapped by the atomic force microscope

Overney, R. M. and Howald, L. and Frommer, J. and Meyer, E. and Guntherodt, H. J.. (1991) Molecular surface structure of tetracene mapped by the atomic force microscope. Journal of Chemical Physics, 94 (12). pp. 8441-8443.

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Official URL: http://edoc.unibas.ch/dok/A5839528

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Abstract

The atomic force microscope has been used to record molecular structure on free-standing organic crystals. A crystal of tetracene has been imaged with molecular resolution which allows the assignment of lattice parameters to the surface layer. The intermolecular spacings on the surface of tetracene correspond remarkably closely with those in the bulk. It is even possible to distinguish between the two translationally inequivalent molecules of the unit cell. The mechanism for using force microscopy to distinguish between different molecular orientations is discussed.
Faculties and Departments:05 Faculty of Science > Departement Physik > Physik > Nanomechanik (Meyer)
UniBasel Contributors:Meyer, Ernst
Item Type:Article, refereed
Article Subtype:Research Article
Publisher:AIP Publishing
ISSN:0021-9606
e-ISSN:1089-7690
Note:Publication type according to Uni Basel Research Database: Journal article
Language:English
Identification Number:
Last Modified:24 Apr 2017 09:10
Deposited On:14 Sep 2012 06:42

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