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Different Response of Atomic Force Microscopy and Scanning Tunnelling Microscopy to Charge Density Waves

Meyer, E. and Wiesendanger, R. and Anselmetti, D. and Hidber, H. R. and Guntherodt, H. J. and Levy, F. and Berger, H.. (1990) Different Response of Atomic Force Microscopy and Scanning Tunnelling Microscopy to Charge Density Waves. Journal of vacuum science & technology. A, Vacuum, surfaces and films, Vol. 8, H. 1. pp. 495-499.

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Official URL: http://edoc.unibas.ch/dok/A5839534

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Faculties and Departments:05 Faculty of Science > Departement Physik > Physik > Nanomechanik (Meyer)
UniBasel Contributors:Meyer, Ernst
Item Type:Article, refereed
Article Subtype:Research Article
Bibsysno:Link to catalogue
Publisher:American Vacuum Society
ISSN:0734-2101
Note:Publication type according to Uni Basel Research Database: Journal article
Identification Number:
Last Modified:14 Sep 2012 07:17
Deposited On:14 Sep 2012 06:42

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