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Fast digital electronics for application in dynamic force microscopy using high-Q cantilevers

Loppacher, C. and Bammerlin, M. and Battiston, F. and Guggisberg, M. and Muller, D. and Hidber, H. R. and Luthi, R. and Meyer, E. and Guntherodt, H. J.. (1998) Fast digital electronics for application in dynamic force microscopy using high-Q cantilevers. Applied physics. A, Materials science & processing, Vol. 66, Part 1 Suppl. S , S215-S218.

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Official URL: http://edoc.unibas.ch/dok/A5839456

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Abstract

One way to improve imaging in dynamic force microscopy is to increase the cantilever resonance frequency. Higher frequencies require faster electronics. This work presents fast new digital electronics based on the principle of phase-locked loop techniques. First results show very high frequency resolution and very stable imaging.
Faculties and Departments:05 Faculty of Science > Departement Physik > Physik > Nanomechanik (Meyer)
UniBasel Contributors:Meyer, Ernst
Item Type:Article, refereed
Article Subtype:Research Article
Bibsysno:Link to catalogue
Publisher:Springer-Verlag
ISSN:1432-0630
Note:Publication type according to Uni Basel Research Database: Journal article
Identification Number:
Last Modified:14 Sep 2012 07:18
Deposited On:14 Sep 2012 06:45

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