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Atomic contact potential variations of Si(111)-7 * 7 analyzed by Kelvin probe force microscopy

Kawai, Shigeki and Glatzel, Thilo and Hug, Hans-Josef and Meyer, Ernst. (2010) Atomic contact potential variations of Si(111)-7 * 7 analyzed by Kelvin probe force microscopy. Nanotechnology, Vol. 21, H. 24 , 245704 (9 pp.).

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Official URL: http://edoc.unibas.ch/dok/A5841202

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Abstract

We studied atomic contact potential variations of Si(111)-7 x 7 by Kelvin probe force microscopy with the amplitude modulation technique at the second resonance of a silicon cantilever. Enhanced sensitivity due to the high mechanical quality factor in ultra-high vacuum enabled local contact potential difference (LCPD) measurements of individual adatoms. The contrast of the measured LCPD map became stronger by reducing the tip-sample distance, and the averaged LCPD value shifted to more negative. The short-range interaction, arising from the covalent bonding interactions, strongly affects the LCPD measurement. Theoretical calculations indicate that the amplitude modulation method has a higher sensitivity than the frequency modulation method in practical cases. The tip-sample distance dependence of LCPD was investigated by numerical calculations.
Faculties and Departments:05 Faculty of Science > Departement Physik > Physik > Nanomechanik (Meyer)
UniBasel Contributors:Meyer, Ernst
Item Type:Article, refereed
Article Subtype:Research Article
Bibsysno:Link to catalogue
Publisher:IOP Publ.
ISSN:0957-4484
Note:Publication type according to Uni Basel Research Database: Journal article
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Last Modified:11 Oct 2012 15:21
Deposited On:14 Sep 2012 06:47

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