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Using higher flexural modes in non-contact force microscopy

Pfeiffer, O. and Loppacher, C. and Wattinger, C. and Bammerlin, M. and Gysin, U. and Guggisberg, M. and Rast, S. and Bennewitz, R. and Meyer, E. and Guntherodt, H. J.. (2000) Using higher flexural modes in non-contact force microscopy. Applied surface science, Vol. 157, H. 4. pp. 337-342.

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Official URL: http://edoc.unibas.ch/dok/A5262161

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Abstract

The oscillation characteristics of higher flexural modes of a rectangular microfabricated silicon cantilever have been studied in ultra-high vacuum (UHV) for a free cantilever and for a typical situation in non-contact force microscopy. The results are discussed with respect to the use of such modes in dynamic force microscopy (DFM) and local dissipation measurements. (C) 2000 Elsevier Science B.V. All rights reserved.
Faculties and Departments:05 Faculty of Science > Departement Physik > Physik > Nanomechanik (Meyer)
UniBasel Contributors:Meyer, Ernst
Item Type:Article, refereed
Article Subtype:Research Article
Bibsysno:Link to catalogue
Publisher:North-Holland
ISSN:0169-4332
Note:Publication type according to Uni Basel Research Database: Journal article
Identification Number:
Last Modified:22 Mar 2012 14:26
Deposited On:22 Mar 2012 13:53

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