Atomic force microscopy : high-resolution and contrast mechanism

Meyer, E. and Heinzelmann, H. and Brodbeck, D. and Overney, G. and Howald, L. and Guntherodt, H. J.. (1990) Atomic force microscopy : high-resolution and contrast mechanism. Helvetica physica acta, Vol. 63, H. 6. pp. 793-794.

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Official URL: http://edoc.unibas.ch/dok/A5839532

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Faculties and Departments:05 Faculty of Science > Departement Physik > Physik > Nanomechanik (Meyer)
UniBasel Contributors:Meyer, Ernst
Item Type:Article, refereed
Article Subtype:Research Article
Note:Publication type according to Uni Basel Research Database: Journal article
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Last Modified:14 Sep 2012 07:17
Deposited On:14 Sep 2012 06:42

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