Multifunctional probe microscope for facile operation in ultrahigh-vacuum

Howald, L. and Meyer, E. and Luthi, R. and Haefke, H. and Overney, R. and Rudin, H. and Guntherodt, H. J.. (1993) Multifunctional probe microscope for facile operation in ultrahigh-vacuum. Applied physics letters, Vol. 63, H. 1. pp. 117-119.

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Official URL: http://edoc.unibas.ch/dok/A5839504

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A scanning force/tunneling microscope (SFM/STM) for remote controlled operation in ultrahigh vacuum (UHV) is described. The lateral forces, normal forces, and tunneling currents between probe tip and sample can all be measured simultaneously. The optical beam deflection detector and the sample position can be adjusted by means of three compact inertial stepping motors. An UHV-compatible light emitting diode is introduced as a general alternative to the widely used laser diode in the detector. Images, taken at 5 X 10(-11) mbar on Si(111) with STM and noncontact SFM, and on NaF(001) with contact SFM, are presented.
Faculties and Departments:05 Faculty of Science > Departement Physik > Physik > Nanomechanik (Meyer)
UniBasel Contributors:Meyer, Ernst
Item Type:Article, refereed
Article Subtype:Research Article
Publisher:American Institute of Physics
Note:Publication type according to Uni Basel Research Database: Journal article
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Last Modified:14 Sep 2012 07:17
Deposited On:14 Sep 2012 06:42

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