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Forces in scanning probe microscopy

Meyer, E. and Hug, H. J. and Luthi, R. and Stiefel, B. and Guntherodt, H. J.. (1998) Forces in scanning probe microscopy. In: Nanoscale science and technology. Dordrecht [etc.], pp. 23-39.

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Official URL: http://edoc.unibas.ch/dok/A5839452

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Abstract

In the last 10 years forces in scanning probe microscopy (SPM) have been an interesting topic with continuing progress. The recently achieved true atomic resolution in dynamic force microscopy in ultrahigh vacuum (UHV) allows a comparison of scanning force microscopy (SFM) with scanning tunneling microscopy (STM) on Si(111)7x7 surfaces. The range of atomic resolution by SFM coincides with the stable tunneling range of STM. Wide area images of a quality comparable to STM have been obtained with a cleaned Si tip on stepped areas of the Si(111)7x7 and on surfaces of ionic crystals. The Magnetic Force Microscope yields new information on the magnetic domain structure of thin magnetic layers and on single flux lines and their pinning in high temperature superconductors. New visions to extend today`s SFM devices to create new sensors and detectors (nano-age mechanics) are discussed.
Faculties and Departments:05 Faculty of Science > Departement Physik > Physik > Nanomechanik (Meyer)
UniBasel Contributors:Meyer, Ernst
Item Type:Conference or Workshop Item
Conference or workshop item Subtype:Conference Paper
Bibsysno:Link to catalogue
Publisher:Kluwer
ISBN:0-7923-5048-0
Series Name:NATO ASI series. Series E, Applied sciences
Issue Number:Vol. 348
Note:Publication type according to Uni Basel Research Database: Conference paper
Identification Number:
Last Modified:08 Jun 2012 06:53
Deposited On:08 Jun 2012 06:29

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