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The analytical relations between particles and probe trajectories in atomic force microscope nanomanipulation

Rao, A. and Gnecco, E. and Marchetto, D. and Mougin, K. and Schoenenberger, M. and Valeri, S. and Meyer, E.. (2009) The analytical relations between particles and probe trajectories in atomic force microscope nanomanipulation. Nanotechnology, Vol. 20, H. 11 , 115706, 6 S..

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Official URL: http://edoc.unibas.ch/dok/A5262092

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Abstract

Analytical expressions relating the trajectories of spherical nanoparticles pushed by an atomic force microscope tip to the scan pattern of the tip are derived. In the case of a raster scan path, the particles are deflected in a direction defined by the geometries of tip and particles and the spacing b between consecutive scan lines. In the case of a zigzag scan path, the particles are deflected in a range of directions around 90 degrees, also depending on the parameter b. Experimental results on gold nanoparticles manipulated on silicon surfaces in ambient conditions confirm the predictions of our model.
Faculties and Departments:05 Faculty of Science > Departement Physik > Physik > Nanomechanik (Meyer)
UniBasel Contributors:Meyer, Ernst
Item Type:Article, refereed
Article Subtype:Research Article
Bibsysno:Link to catalogue
Publisher:IOP Publ.
ISSN:0957-4484
Note:Publication type according to Uni Basel Research Database: Journal article
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Last Modified:22 Mar 2012 14:27
Deposited On:22 Mar 2012 13:57

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