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Systematic achievement of improved atomic-scale contrast via bimodal dynamic force microscopy

Kawai, Shigeki and Glatzel, Thilo and Koch, Sascha and Such, Bartosz and Baratoff, Alexis and Meyer, Ernst. (2009) Systematic achievement of improved atomic-scale contrast via bimodal dynamic force microscopy. Physical review letters, Vol. 103, H. 22 , 220801, 4 S..

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Official URL: http://edoc.unibas.ch/dok/A5262085

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Abstract

Judiciously matched experiments, calculations, and theory demonstrate that a higher sensitivity to short-range interactions and, consequently, improved resolution on the atomic scale can be achieved by bimodal noncontact dynamic force microscopy. The combination of sub-A degrees ngstroumlm tip oscillation at the second flexural resonance of a commercially available silicon cantilever with the commonly used large amplitude oscillation at the fundamental resonance frequency enables this performance improvement while avoiding potentially damaging jump-to-contact instabilities.
Faculties and Departments:05 Faculty of Science > Departement Physik > Physik > Nanomechanik (Meyer)
UniBasel Contributors:Meyer, Ernst
Item Type:Article, refereed
Article Subtype:Research Article
Bibsysno:Link to catalogue
Publisher:American Physical Society
ISSN:0031-9007
Note:Publication type according to Uni Basel Research Database: Journal article
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Last Modified:22 Mar 2012 14:26
Deposited On:22 Mar 2012 13:53

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