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Atomic resolution in dynamic force microscopy across steps on Si(111)7 x 7

Luthi, R. and Meyer, E. and Bammerlin, M. and Baratoff, A. and Lehmann, T. and Howald, L. and Gerber, C. and Guntherodt, H. J.. (1996) Atomic resolution in dynamic force microscopy across steps on Si(111)7 x 7. Zeitschrift für Physik. B, Condensed matter, Vol. 100, H. 2. pp. 165-167.

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Official URL: http://edoc.unibas.ch/dok/A5839473

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Abstract

In this note we report the first observation of salient features of the Si(111)7 x 7 reconstructed surface across monatomic steps by dynamic atomic force microscopy (AFM) in ultrahigh vacuum (UHV). Simultaneous measurements of the resonance frequency shift Delta f of the Si-cantilever and of the mean tunneling current >(I)over bar (t)< from the cleaned Si tip indicate a restricted range for stable imaging with true atomic resolution. The corresponding characteristics vs. distance reveal why feedback control via AS is problematic, whereas it is as successful as in conventional STM via >(I)over bar (t)<.
Faculties and Departments:05 Faculty of Science > Departement Physik > Physik > Nanomechanik (Meyer)
UniBasel Contributors:Meyer, Ernst
Item Type:Article, refereed
Article Subtype:Research Article
Bibsysno:Link to catalogue
Publisher:Springer
ISSN:0722-3277
Note:Publication type according to Uni Basel Research Database: Journal article
Identification Number:
Last Modified:14 Sep 2012 07:18
Deposited On:14 Sep 2012 06:43

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