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Scanning force microscopy on the Si(111)7×7 surface reconstruction

Howald, L. and Luthi, R. and Meyer, E. and Guthner, P. and Guntherodt, H. J.. (1994) Scanning force microscopy on the Si(111)7×7 surface reconstruction. Zeitschrift für Physik. B, Condensed matter, Vol. 93, H. 3. pp. 267-268.

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Official URL: http://edoc.unibas.ch/dok/A5839499

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Abstract

Scanning force microscopy images of the Si(111)7 x 7 surface reconstruction are presented which are taken in the contact mode in ultrahigh vacuum. Topographic and lateral force data are acquired simultaneously. A special treatment of the sensing tip with PTFE helps to overcome the strong adhesion and wear effects that normally occur on this particular surface.
Faculties and Departments:05 Faculty of Science > Departement Physik > Physik > Nanomechanik (Meyer)
UniBasel Contributors:Meyer, Ernst
Item Type:Article, refereed
Article Subtype:Research Article
Bibsysno:Link to catalogue
Publisher:Springer
ISSN:0722-3277
Note:Publication type according to Uni Basel Research Database: Journal article
Identification Number:
Last Modified:14 Sep 2012 07:18
Deposited On:14 Sep 2012 06:42

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