edoc

Atomic force microscopy

Meyer, E.. (1992) Atomic force microscopy. Progress In Surface Science, Vol. 41, H. 1. pp. 3-49.

Full text not available from this repository.

Official URL: http://edoc.unibas.ch/dok/A5839511

Downloads: Statistics Overview

Abstract

The basic principles of atomic force microscopy are discussed. Various deflection sensors are described and compared with each other. A simple theoretical basis of the fundamental forces, such as van der Waals, electrostatic, magnetic, capillary, ionic repulsion and frictional forces, is given and the relevant experimental work is summarized.
Faculties and Departments:05 Faculty of Science > Departement Physik > Physik > Nanomechanik (Meyer)
UniBasel Contributors:Meyer, Ernst
Item Type:Article, refereed
Article Subtype:Research Article
Bibsysno:Link to catalogue
Publisher:Elsevier
ISSN:0079-6816
Note:Publication type according to Uni Basel Research Database: Journal article
Identification Number:
Last Modified:14 Sep 2012 07:17
Deposited On:14 Sep 2012 06:42

Repository Staff Only: item control page