Frictional and atomic-scale study of C60 thin films by scanning force microscopy

Luthi, R. and Haefke, H. and Meyer, E. and Howald, L. and Lang, H. P. and Gerth, G. and Guntherodt, H. J.. (1994) Frictional and atomic-scale study of C60 thin films by scanning force microscopy. Zeitschrift für Physik. B, Condensed matter, Vol. 95, H. 1. pp. 1-3.

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Official URL: http://edoc.unibas.ch/dok/A5839488

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Scanning force microscopy (SFM) was employed to characterize C60 island films in an ultra-high vacuum (UHV). The initial growth stage of C60 on NaCl cleavage faces and nanotribological properties of this solid lubricant are investigated. In comparison to the NaCl(001) face, higher friction is measured on the C60 islands, resulting in a ratio of friction of 1:3 for NaCl:C60. The friction coefficient of the (111) oriented C60 island is determined to be 0.15+/-0.05. High-resolution SFM images reveal the hexagonal lattice of the unreconstructed (111) top surfaces and the overgrowth relationships of the C60 islands.
Faculties and Departments:05 Faculty of Science > Departement Physik > Physik > Nanomechanik (Meyer)
UniBasel Contributors:Meyer, Ernst
Item Type:Article, refereed
Article Subtype:Research Article
Note:Publication type according to Uni Basel Research Database: Journal article
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Last Modified:14 Sep 2012 07:18
Deposited On:14 Sep 2012 06:43

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