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Dynamic force microscopy across steps on the Si(111)-(7 x 7) surface

Guggisberg, M. and Bammerlin, M. and Baratoff, A. and Luthi, R. and Loppacher, C. and Battiston, F. M. and Lu, J. and Bennewitz, R. and Meyer, E. and Guntherodt, H. J.. (2000) Dynamic force microscopy across steps on the Si(111)-(7 x 7) surface. Surface science, Vol. 461, H. 1-3. pp. 255-265.

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Official URL: http://edoc.unibas.ch/dok/A5262155

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Abstract

Force microscopy in atomic resolution with an oscillating tip has been performed across monatomic steps of the Si(111)-(7 x 7) surface using the tunnelling current or frequency shift as the feedback parameter. The contrast of simultaneously recorded images in both feedback modes is discussed. A significant difference between tip-sample interactions on the upper and lower terrace close to a step is analyzed in detail by means of Kelvin-type measurements. No contact potential variation across the step is found. A simple model for the force contrast is suggested which takes into account the different effective interaction areas or volumes on the upper and the lower terrace.
Faculties and Departments:05 Faculty of Science > Departement Physik > Physik > Nanomechanik (Meyer)
UniBasel Contributors:Meyer, Ernst
Item Type:Article, refereed
Article Subtype:Research Article
Bibsysno:Link to catalogue
Publisher:Elsevier
ISSN:0039-6028
Note:Publication type according to Uni Basel Research Database: Journal article
Identification Number:
Last Modified:22 Mar 2012 14:26
Deposited On:22 Mar 2012 13:53

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