Lateral-force measurements in dynamic force microscopy

Pfeiffer, O. and Bennewitz, R. and Baratoff, A. and Meyer, E. and Grutter, P.. (2002) Lateral-force measurements in dynamic force microscopy. Physical Review B, Vol. 65, H. 16 , 0161403, 4 S..

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Official URL: http://edoc.unibas.ch/dok/A5262140

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Lateral forces between the tip of a force microscope and atomic-scale features on the surface of a sample can be accurately measured in a noncontact mode. Feedback-controlled excitation of the torsional eigenmode of a rectangular cantilever beam forces the tip to oscillate parallel to the surface. Forces of the order of 0.05 nN have been detected when the tip approaches a step or a sulphur impurity. The method can also be used to study the energy dissipation in the range where a tip-sample contact is formed.
Faculties and Departments:05 Faculty of Science > Departement Physik > Physik > Nanomechanik (Meyer)
UniBasel Contributors:Meyer, Ernst
Item Type:Article, refereed
Article Subtype:Research Article
Publisher:American Institute of Physics
Note:Publication type according to Uni Basel Research Database: Journal article
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Last Modified:22 Mar 2012 14:25
Deposited On:22 Mar 2012 13:48

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