Functional microcantilever for a novel scanning force microscope

Lee, Dong-Weon and Wetzel, Adrian and Meyer, Ernst. (2008) Functional microcantilever for a novel scanning force microscope. Journal of the Korean Physical Society, Vol. 52, H. 5. pp. 1496-1500.

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Official URL: http://edoc.unibas.ch/dok/A5262102

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This paper presents a novel scanning probe microscope that is combined with a time-of-flight mass spectrometer for analyzing material properties of solid surfaces. Chemical analysis on the nanometer scale is achieved by transferring material from surfaces via the probing tip to the mass spectrometer under. an ultrahigh vacuum condition. The instrument based on a rotatable probe holder or an actuator-integrated microcantilever allows quasi-simultaneous topographical and chemical analyses of solid surfaces to be performed in the same way as with the conventional scanning probe technique. The basic characteristics of the instrument are evaluated using the motorized rotatable probe holder and electrochemically etched tungsten tips. A Further increase of the switching speed between the scanning probe and mass analysis operation is realized by using the functional micro cantilever, instead of a motorized rotatable holder.
Faculties and Departments:05 Faculty of Science > Departement Physik > Physik > Nanomechanik (Meyer)
UniBasel Contributors:Meyer, Ernst
Item Type:Article
Article Subtype:Research Article
Note:Publication type according to Uni Basel Research Database: Journal article
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Last Modified:22 Mar 2012 14:27
Deposited On:22 Mar 2012 13:57

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