Comparison of dynamic lever STM and noncontact AFM

Guggisberg, M. and Bammerlin, M. and Luthi, R. and Loppacher, C. and Battiston, F. and Lu, J. and Baratoff, A. and Meyer, E. and Guntherodt, H. J.. (1998) Comparison of dynamic lever STM and noncontact AFM. Applied physics. A, Materials science & processing, Vol. 66, Part 1 Suppl. S , S245-S248.

Full text not available from this repository.

Official URL: http://edoc.unibas.ch/dok/A5839457

Downloads: Statistics Overview


We investigate interaction effects which occur in scanning tunneling microscopy (STM) by performing local force spectroscopy with an oscillating tip while imaging Si(111)7 x 7 terraces in the dynamic lever STM mode (constant time-averaged current). It is found that true atomic resolution is achieved close to the minimum of the resonance frequency vs. distance curve and even closer to the sample. On the other hand true atomic resolution in noncontact AFM (constant frequency shift) is expected several nm away from this minimum, in the range where the frequency shift becomes more negative with decreasing distance.
Faculties and Departments:05 Faculty of Science > Departement Physik > Physik > Nanomechanik (Meyer)
UniBasel Contributors:Meyer, Ernst
Item Type:Article, refereed
Article Subtype:Research Article
Note:Publication type according to Uni Basel Research Database: Journal article
Identification Number:
Last Modified:14 Sep 2012 07:18
Deposited On:14 Sep 2012 06:45

Repository Staff Only: item control page