edoc

Instrumental aspects of magnetic resonance force microscopy

Streckeisen, P. and Rast, S. and Wattinger, C. and Meyer, E. and Vettiger, P. and Gerber, C. and Guntherodt, H. J.. (1998) Instrumental aspects of magnetic resonance force microscopy. Applied physics. A, Materials science & processing, Vol. 66, Part 1 Suppl. S , S341-S344.

Full text not available from this repository.

Official URL: http://edoc.unibas.ch/dok/A5839460

Downloads: Statistics Overview

Abstract

A novel sample preparation technique for deposition of small volumes from the liquid phase is described. Samples with diameters as small as 0.5 mu m were created with this technique. A series of cantilever geometries was manufactured, with the aim of optimizing the e-factor. Force sensitivities of 8 x 10(-17) N/root Hz were achieved at room temperature, which is a considerable improvement over commercial cantilevers. Mechanisms which determine e-factors are discussed briefly. Quantitative understanding of MRFM is absolutely necessary. Calculations of the magnetic field and field gradients for several types of permanent magnets are presented.
Faculties and Departments:05 Faculty of Science > Departement Physik > Physik > Nanomechanik (Meyer)
UniBasel Contributors:Meyer, Ernst
Item Type:Article, refereed
Article Subtype:Research Article
Bibsysno:Link to catalogue
Publisher:Springer-Verlag
ISSN:1432-0630
Note:Publication type according to Uni Basel Research Database: Journal article
Identification Number:
Last Modified:14 Sep 2012 07:18
Deposited On:14 Sep 2012 06:45

Repository Staff Only: item control page