Items where Author is "Gysin, Urs"

Yes

Glatzel, Thilo and Gysin, Urs and Meyer, Ernst. (2022) Kelvin probe force microscopy for material characterization. Microscopy, 71 (Supplement_1). i165-i173.

Yildiz, Dilek and Kisiel, Marcin and Gysin, Urs and Gürlü, Oguzhan and Meyer, Ernst. (2019) Mechanical dissipation via image potential states on a topological insulator surface. Nature Materials, 18 (11). pp. 1201-1206.

Kisiel, Marcin and Brovko, Oleg O. and Yildiz, Dilek and Pawlak, Remy and Gysin, Urs and Tosatti, Erio and Meyer, Ernst. (2018) Mechanical dissipation from charge and spin transitions in oxygen-deficient SrTiO3 surfaces. Nature Communications, 9.

Gysin, Urs and Glatzel, Thilo and Schmölzer, Thomas and Schöner, Adolf and Reshanov, Sergey and Bartolf, Holger and Meyer, Ernst. (2015) Large area scanning probe microscope in ultra-high vacuum demonstrated for electrostatic force measurements on high-voltage devices. Beilstein Journal of Nanotechnology, 6. pp. 2485-2497.

Rossmann, H. R. and Gysin, Urs and Bubendorf, Alexander and Glatzel, Thilo and Reshanov, Sergey and Schöner, Adolf and Jung, T. A. and Meyer, Ernst and Bartolf, Holger. (2015) Two-Dimensional Carrier Profiling on Lightly Doped n-Type 4H-SiC Epitaxially Grown Layers. Materials Science Forum, 821-823. pp. 269-272.

Fessler, Gregor and Eren, Baran and Gysin, Urs and Glatzel, Thilo and Meyer, Ernst. (2014) Friction force microscopy studies on SiO2 supported pristine and hydrogenated graphene. Applied physics letters, 104 (4). 041910.

Wirtz, Tom and Fleming, Yves and Gysin, Urs and Glatzel, Thilo and Wegmann, Urs and Meyer, Ernst and Maier, Urs and Rychen, Joerg. (2013) Combined SIMS-SPM instrument for high sensitivity and high-resolution elemental 3D analysis. Surface and interface analysis, Vol. 45, H. 1,. pp. 513-516.

Eren, Baran and Glatzel, Thilo and Kisiel, Marcin and Fu, Wangyang and Pawlak, Rémy and Gysin, Urs and Nef, Cornelia and Marot, Laurent and Calame, Michel and Schönenberger, Christian and Meyer, Ernst. (2013) Hydrogen plasma microlithography of graphene supported on a Si/SiO2 substrate. Applied physics letters, 102 (7). 071602.

Wirtz, Tom and Fleming, Yves and Gerard, Mathieu and Gysin, Urs and Glatzel, Thilo and Meyer, Ernst and Wegmann, Urs and Maier, Urs and Odriozola, Aitziber Herrero and Uehli, Daniel. (2012) Design and performance of a combined secondary ion mass spectrometry-scanning probe microscopy instrument for high sensitivity and high-resolution elemental three-dimensional analysis. Review of scientific instruments, Vol. 83, H. 6 , 063702.

Gysin, Urs and Rast, Simon and Aste, Andreas and Speliotis, Thanassis and Werle, Christoph and Meyer, Ernst. (2011) Magnetic properties of nanomagnetic and biomagnetic systems analyzed using cantilever magnetometry. Nanotechnology, 22 (28). p. 285715.

Kisiel, Marcin and Gnecco, Enrico and Gysin, Urs and Marot, Laurent and Rast, Simon and Meyer, Ernst. (2011) Suppression of electronic friction on Nb films in the superconducting state. Nature materials, 10 (2). pp. 119-122.