Items where Author is "Brodbeck, D."

Article

Wyder Peters, L. and Molle, K. D. and Thiemeyer, A. and Knopf, A. and Goxe, M. and Guerry, P. and Brodbeck, D. and Colombi, M. and Hall, M. N. and Moroni, C. and Regenass, U.. (2013) An Isogenic Cell Panel Identifies Compounds That Inhibit Proliferation of mTOR-Pathway Addicted Cells by Different Mechanisms. Journal of Biomolecular Screening, 19 (1). pp. 131-144.

Brodbeck, D. and Amherd, R. and Callaerts, P. and Hintermann, E. and Meyer, U. A. and Affolter, M.. (1998) Molecular and biochemical characterization of the aaNAT1 (Dat) locus in Drosophila melanogaster : differential expression of two gene products. DNA and cell biology, Vol. 17, H. 7. pp. 621-633.

Meyer, E. and Overney, R. and Brodbeck, D. and Howald, L. and Luthi, R. and Frommer, J. and Guntherodt, H. J.. (1992) Friction and wear of Langmuir-Blodgett films observed by friction force microscopy. Physical review letters, Vol. 69, H. 12. pp. 1777-1780.

Meyer, E. and Overney, R. and Luthi, R. and Brodbeck, D. and Howald, L. and Frommer, J. and Guntherodt, H. J. and Wolter, O. and Fujihira, M. and Takano, H. and Gotoh, Y.. (1992) Friction forc emicroscopy of mixed Langmuir-Blodgett films. Thin Solid Films, Vol. 220, H. 1-2. pp. 132-137.

Overney, R. M. and Meyer, E. and Frommer, J. and Brodbeck, D. and Luthi, R. and Howald, L. and Guntherodt, H. J. and Fujihira, M. and Takano, H. and Gotoh, Y.. (1992) Friction measurements on phase-separated thin films with a modified atomic force microscope. Nature, Vol. 359, H. 6391. pp. 133-135.

Luthi, R. and Overney, R. M. and Meyer, E. and Howald, L. and Brodbeck, D. and Guntherodt, H. J.. (1992) Measurements on Langmuir-Blodgett-films by friction force microscopy. Helvetica physica acta, Vol. 65, H. 6. pp. 866-867.

Overney, R. M. and Howald, L. and Frommer, J. and Meyer, E. and Brodbeck, D. and Guntherodt, H. J.. (1992) Molecular surface structure of organic crystals observed by atomic force microscopy. Ultramicroscopy, Vol. 42, Part B. pp. 983-988.

Brodbeck, D. and Howald, L. and Luthi, R. and Meyer, E. and Overney, R.. (1992) Scan control and data acquisition for bidirectional force microscopy. Ultramicroscopy, Vol. 42, Part B. pp. 1580-1584.

Meyer, E. and Howald, L. and Overney, R. and Brodbeck, D. and Luthi, R. and Haefke, H. and Frommer, J. and Guntherodt, H. J.. (1992) Structure and dynamics of solid surfaces observed by atomic force microscopy. Ultramicroscopy, Vol. 42, Part A. pp. 274-280.

Jung, T. A. and Moser, A. and HUG, H. J. and Brodbeck, D. and Hofer, R. and Hidber, H. R. and Schwarz, U. D.. (1992) The atomic force microscope used as a powerful tool for machining surfaces. ULTRAMICROSCOPY, 42-44 (2). pp. 1446-1451.

Meyer, E. and Heinzelmann, H. and Brodbeck, D. and Overney, G. and Overney, R. and Howald, L. and HUG, H. and Jung, T. and Hidber, H. R. and Guntherodt, H. J.. (1991) Atomic resolution on the surface of LiF(100) by atomic force microscopy. Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement, and phenomena, Vol. 9, H. 2, Part 2. pp. 1329-1332.

Meyer, E. and Heinzelmann, H. and Brodbeck, D. and Overney, G. and Howald, L. and Guntherodt, H. J.. (1990) Atomic force microscopy : high-resolution and contrast mechanism. Helvetica physica acta, Vol. 63, H. 6. pp. 793-794.