Items where Author is "Hug, H. J."

Article

Schwenk, J. and Zhao, X. and Bacani, M. and Marioni, M. A. and Romer, S. and Hug, H. J.. (2015) Bimodal magnetic force microscopy with capacitive tip-sample distance control. Applied physics letters, 107 (13). p. 132407.

Hoogenboom, B. W. and Frederix, Pltm and Fotiadis, D. and Hug, H. J. and Engel, A.. (2008) Potential of interferometric cantilever detection and its application for SFM/AFM in liquids. Nanotechnology, Vol. 19. pp. 384019-384025.

Hoogenboom, B. W. and Hug, H. J. and Pellmont, Y. and Martin, S. and Frederix, P. L. T. M. and Fotiadis, D. and Engel, A.. (2006) Quantitative dynamic-mode scanning force microscopy in liquid,. Applied Physics Letters, Vol. 88. p. 193109.

Hoogenboom, B. W. and Frederix, P. L. T. M. and Yang, J. and Martin, S. and Pellmont, Y. and Steinacher, M. and Zäch, S. and Langenbach, E. and Heimbeck, H. -J. and Engel, A. and Hug, H. J.. (2005) A Fabry-Perot interferometer for micrometer-sized cantilevers. Applied Physics Letters, Vol. 86. 074101.

Yang, J. L. and Despont, M. and Drechsler, U. and Hoogenboom, B. W. and Frederix, P. L. T. M. and Martin, S. and Engel, A. and Vettiger, P. and Hug, H. J.. (2005) Miniaturized single-crystal silicon cantilevers for scanning force microscopy. Applied Physics Letters, Vol. 86. p. 134101.

Gutmannsbauer, W. and Hug, H. J. and Meyer, E.. (1996) Scanning probe microscopy for nanometer inspections and industrial applications. Microelectronic engineering, Vol. 32, H. 1-4. pp. 389-409.

Kroener, T. and Linker, G. and Meyer, O. and Strehlau, B. and Wolf Th., Th. and Hug, H. J. and Jung, T. A. and Güntherodt, H. -J.. (1992) Atomic force microscopy characterization of a YBaCuO crystal surface patterned by proton irradiation. Physica C: Superconductivity and its Applications, 191 (1-2). pp. 243-247.

Conference or Workshop Item

Meyer, E. and Hug, H. J. and Luthi, R. and Stiefel, B. and Guntherodt, H. J.. (1998) Forces in scanning probe microscopy. In: Nanoscale science and technology. Dordrecht [etc.], pp. 23-39.

Jung, T. A. and Moser, A. and Gale, Michael T. and Hug, H. J. and Schwarz, U. D.. (1993) Atomic force microscopy experimentation at surfaces: hardness, wear and lithographic applications. In: Technology of Proximal Probe Lithography. Proceedings, 10310. 103100E.