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Bimodal magnetic force microscopy with capacitive tip-sample distance control

Schwenk, J. and Zhao, X. and Bacani, M. and Marioni, M. A. and Romer, S. and Hug, H. J.. (2015) Bimodal magnetic force microscopy with capacitive tip-sample distance control. Applied physics letters, 107 (13). p. 132407.

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Official URL: http://edoc.unibas.ch/44024/

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Abstract

A single-passage, bimodal magnetic force microscopy technique optimized for scanning samples with arbitrary topography is discussed. A double phase-locked loop (PLL) system is used to mechanically excite a high quality factor cantilever under vacuum conditions on its first mode and via an oscillatory tip-sample potential on its second mode. The obtained second mode oscillation amplitude is then used as a proxy for the tip-sample distance, and for the control thereof. With appropriate z-feedback parameters two data sets reflecting the magnetic tip-sample interaction and the sample topography are simultaneously obtained.
Faculties and Departments:05 Faculty of Science > Departement Physik > Physik
UniBasel Contributors:Hug, Hans Josef
Item Type:Article, refereed
Article Subtype:Research Article
Publisher:American Institute of Physics
ISSN:0003-6951
Note:Publication type according to Uni Basel Research Database: Journal article
Language:English
Identification Number:
Last Modified:05 Apr 2017 14:49
Deposited On:05 Sep 2016 07:30

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