Items where Author is "Hidber, H. R."

Yes

Loppacher, C. and Bammerlin, M. and Battiston, F. and Guggisberg, M. and Muller, D. and Hidber, H. R. and Luthi, R. and Meyer, E. and Guntherodt, H. J.. (1998) Fast digital electronics for application in dynamic force microscopy using high-Q cantilevers. Applied physics. A, Materials science & processing, Vol. 66, Part 1 Suppl. S , S215-S218.

Jung, T. A. and Moser, A. and HUG, H. J. and Brodbeck, D. and Hofer, R. and Hidber, H. R. and Schwarz, U. D.. (1992) The atomic force microscope used as a powerful tool for machining surfaces. ULTRAMICROSCOPY, 42-44 (2). pp. 1446-1451.

Meyer, E. and Heinzelmann, H. and Brodbeck, D. and Overney, G. and Overney, R. and Howald, L. and HUG, H. and Jung, T. and Hidber, H. R. and Guntherodt, H. J.. (1991) Atomic resolution on the surface of LiF(100) by atomic force microscopy. Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement, and phenomena, Vol. 9, H. 2, Part 2. pp. 1329-1332.

Meyer, E. and Wiesendanger, R. and Anselmetti, D. and Hidber, H. R. and Guntherodt, H. J. and Levy, F. and Berger, H.. (1990) Different Response of Atomic Force Microscopy and Scanning Tunnelling Microscopy to Charge Density Waves. Journal of vacuum science & technology. A, Vacuum, surfaces and films, Vol. 8, H. 1. pp. 495-499.

Grutter, P. and Meyer, E. and Heinzelmann, H. and Rosenthaler, L. and Hidber, H. R. and Guntherodt, H. J.. (1988) Application of atomic force microscopy to magnetic materials. Journal of vacuum science & technology. A, Vacuum, surfaces and films, Vol. 6, H. 2. pp. 279-282.

Heinzelmann, H. and Meyer, E. and Grutter, P. and Hidber, H. R. and Rosenthaler, L. and Guntherodt, H. J.. (1988) Atomic force microscopy : general aspects and application to insulators. Journal of vacuum science & technology. A, Vacuum, surfaces and films, Vol. 6, H. 2. pp. 275-278.

No

Dammer, U. and Anselmetti, D. and Dreier, M. and Frommer, J. and Funfschilling, J. and Gerth, G. and Guntherodt, H. J. and Haefke, H. and Hidber, H. R. and Howald, L. and HUG, H. J. and Jung, T. H. and Lang, H. P. and Luthi, R. and Meyer, E. and Moser, A. and Parashikov, I. and Reimann, P. and Richmond, T. and Ruetschi, M. and Rudin, H. and Schwarz, U. D. and Staufer, U. and SUM, R.. (1993) Scanning probe microscopy for industrial applications : selected examples. Scanning, Vol. 15, H. 5. pp. 257-264.