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Items where Author is "Wirtz, Tom"

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Jump to: 2013 | 2012
Number of items: 2.

2013

Wirtz, Tom and Fleming, Yves and Gysin, Urs and Glatzel, Thilo and Wegmann, Urs and Meyer, Ernst and Maier, Urs and Rychen, Joerg. (2013) Combined SIMS-SPM instrument for high sensitivity and high-resolution elemental 3D analysis. Surface and interface analysis, Vol. 45, H. 1,. pp. 513-516.

2012

Wirtz, Tom and Fleming, Yves and Gerard, Mathieu and Gysin, Urs and Glatzel, Thilo and Meyer, Ernst and Wegmann, Urs and Maier, Urs and Odriozola, Aitziber Herrero and Uehli, Daniel. (2012) Design and performance of a combined secondary ion mass spectrometry-scanning probe microscopy instrument for high sensitivity and high-resolution elemental three-dimensional analysis. Review of scientific instruments, Vol. 83, H. 6 , 063702.

This list was generated on Thu Oct 6 19:41:11 2022 CEST.