Items where Author is "Schimmel, Thomas"
Jump to: Article Number of items: 3. ArticleBubendorf, Alexandre and Walheim, Stefan and Schimmel, Thomas and Meyer, Ernst. (2018) A robust AFM-based method for locally measuring the elasticity of samples. BEILSTEIN JOURNAL OF NANOTECHNOLOGY, 9. pp. 1-10. Glatzel, Thilo and Garcia, Ricardo and Schimmel, Thomas. (2014) Advanced atomic force microscopy techniques II. Beilstein Journal of Nanotechnology, 5. pp. 2326-2327. Barczewski, Matthias and Walheim, Stefan and Heiler, Tobias and Błaszczyk, Alfred and Mayor, Marcel and Schimmel, Thomas. (2010) High aspect ratio constructive nanolithography with a photo-fimerizable molecule. Langmuir, 26 (5). pp. 3623-3628. |