Advanced atomic force microscopy techniques II

Glatzel, Thilo and Garcia, Ricardo and Schimmel, Thomas. (2014) Advanced atomic force microscopy techniques II. Beilstein Journal of Nanotechnology, 5. pp. 2326-2327.

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Official URL: http://edoc.unibas.ch/41468/

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Faculties and Departments:05 Faculty of Science > Departement Physik > Physik > Nanomechanik (Meyer)
UniBasel Contributors:Glatzel, Thilo
Item Type:Article, refereed
Article Subtype:Research Article
Note:Publication type according to Uni Basel Research Database: Journal article
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Last Modified:30 Jun 2016 11:02
Deposited On:18 May 2016 07:27

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