Glatzel, Thilo and Garcia, Ricardo and Schimmel, Thomas. (2014) Advanced atomic force microscopy techniques II. Beilstein Journal of Nanotechnology, 5. pp. 2326-2327.
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Official URL: http://edoc.unibas.ch/41468/
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| Faculties and Departments: | 05 Faculty of Science > Departement Physik > Physik > Nanomechanik (Meyer) |
|---|---|
| UniBasel Contributors: | Glatzel, Thilo |
| Item Type: | Article, refereed |
| Article Subtype: | Research Article |
| Publisher: | Beilstein-Institut |
| ISSN: | 2190-4286 |
| Note: | Publication type according to Uni Basel Research Database: Journal article |
| Identification Number: |
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| Last Modified: | 30 Jun 2016 11:02 |
| Deposited On: | 18 May 2016 07:27 |
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